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Institution Date Title Author
國立交通大學 2020-02-02T23:54:25Z Charge transport mechanism in SiNx-based memristor Gismatulin, A. A.; Gritsenko, V. A.; Yen, T-J; Chin, A.
國立交通大學 2019-08-02T02:18:30Z Memristor effect in GeO[SiO2] and GeO[SiO] solid alloys films Volodin, V. A.; Kamaev, G. N.; Gritsenko, V. A.; Gismatulin, A. A.; Chin, A.; Vergnat, M.
國立交通大學 2019-05-02T00:25:57Z Mechanism of stress induced leakage current in Si3N4 Gritsenko, V. A.; Gismatulin, A. A.; Baraban, A. P.; Chin, A.
國立交通大學 2019-04-02T06:00:15Z Charge transport mechanism of high-resistive state in RRAM based on SiOx Gismatulin, A. A.; Kruchinin, V. N.; Gritsenko, V. A.; Prosvirin, I. P.; Yen, T. -J.; Chin, A.
國立交通大學 2019-04-02T05:58:25Z Multiphonon trap ionization transport in nonstoichiometric SiNx Gritsenko, V. A.; Gismatulin, A. A.; Chin, A.

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