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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立交通大學 |
2020-02-02T23:54:25Z |
Charge transport mechanism in SiNx-based memristor
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Gismatulin, A. A.; Gritsenko, V. A.; Yen, T-J; Chin, A. |
| 國立交通大學 |
2019-08-02T02:18:30Z |
Memristor effect in GeO[SiO2] and GeO[SiO] solid alloys films
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Volodin, V. A.; Kamaev, G. N.; Gritsenko, V. A.; Gismatulin, A. A.; Chin, A.; Vergnat, M. |
| 國立交通大學 |
2019-05-02T00:25:57Z |
Mechanism of stress induced leakage current in Si3N4
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Gritsenko, V. A.; Gismatulin, A. A.; Baraban, A. P.; Chin, A. |
| 國立交通大學 |
2019-04-02T06:00:15Z |
Charge transport mechanism of high-resistive state in RRAM based on SiOx
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Gismatulin, A. A.; Kruchinin, V. N.; Gritsenko, V. A.; Prosvirin, I. P.; Yen, T. -J.; Chin, A. |
| 國立交通大學 |
2019-04-02T05:58:25Z |
Multiphonon trap ionization transport in nonstoichiometric SiNx
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Gritsenko, V. A.; Gismatulin, A. A.; Chin, A. |
Showing items 1-5 of 5 (1 Page(s) Totally)
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