|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"guo j q"
Showing items 1-7 of 7 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立成功大學 |
2023 |
Impact of Nanosheet Thickness on Performance and Reliability of Polycrystalline-Silicon Thin-Film Transistors With Double-Gate Operation
|
Ma, W.C.-Y.;Su, C.-J.;Kao, Kao K.-H.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2023 |
Ferroelectric Tunnel Thin-Film Transistor for Synaptic Applications
|
Ma, W.C.;Su, C.-J.;Kao, Kao K.-H.;Cho, T.-C.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2023 |
Exploring Performance and Reliability Behavior of Nanosheet Channel Thin-Film Transistors under Independent Dual Gate Bias Operation
|
Ma, W.C.;Su, C.-J.;Kao, Kao K.-H.;Chen, Y.-Q.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2023 |
Impacts of Asymmetry Double Gate Structure on Reliability Degradation of Thin-Film Transistor with Nanosheet Channel
|
Ma, W.C.-Y.;Su, C.-J.;Kao, Kao K.-H.;Cho, T.-C.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2023 |
Insights of Nanosheet Channel Thickness on Reliability Degradation of Thin-Film Transistor
|
Ma, W.C.-Y.;Su, C.-J.;Kao, Kao K.-H.;Cho, T.-C.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2023 |
Tunnel Thin-Film Transistor Featuring Ferroelectric Gate Stack for Synaptic Applications
|
Ma, W.C.-Y.;Su, C.-J.;Kao, Kao K.-H.;Cho, T.-C.;Guo, J.-Q.;Wu, C.-J.;Wu, P.-Y.;Hung, J.-Y. |
| 國立成功大學 |
2018 |
Infection by the nematode Angiostrongylus cantonensis induces differential expression of miRNAs in mouse brain
|
Mo, Z.-X.;Guo, J.-Q.;She, D.;Zhang, X.;Puthiyakunnon, S.;Chen, X.-G.;Wu, Z.-D.;Shin, J.-W.;Cui, L.-W.;Li, H. |
Showing items 1-7 of 7 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
