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Institution Date Title Author
國立交通大學 2020-10-05T01:59:50Z SiC Strained nMOSFETs With Enhanced High- Frequency Performance and Impact on Flicker Noise and Random Telegraph Noise Guo, Jyh-Chyurn; Chang, Chih-Shiang
國立交通大學 2020-05-05T00:01:56Z A New Compact Model for Accurate Simulation of RF Noise in Sub-40nm Multi-finger nMOSFETs Yeh, Kuo-Liang; Guo, Jyh-Chyurn
國立交通大學 2020-02-02T23:55:33Z New Observation and Analysis of Layout Dependent Effects in Sub-40nm Multi-Ring and Multi-Finger nMOSFETs for High Frequency Applications Li, Zu-Cheng; Guo, Jyh-Chyurn; Lin, Jinq-Min
國立交通大學 2019-12-13T01:12:53Z The Impact of Layout Dependent Intrinsic Parasitic RLC on High Frequency Performance in 3T and 4T Multi-finger nMOSFETs Guo, Jyh-Chyurn; Ou, Jyun-Rong; Lin, Jinq-Min
國立交通大學 2018-08-21T05:57:06Z Low Power UWB CMOS LNA Using Resistive Feedback and Current-Reused Techniques Under Forward Body Bias Guo, Jyh-Chyurn; Lin, Ching-Shiang
國立交通大學 2018-08-21T05:57:01Z Low Voltage and Low power UWB CMOS LNA using Current-Reused and Forward Body Biasing Techniques Guo, Jyh-Chyurn; Lin, Ching-Shiang; Liang, Yu-Tang
國立交通大學 2018-08-21T05:56:54Z The Impact of Uniaxial Strain on Flicker Noise and Random Telegraph Noise of SiC Strained nMOSFETs in 40nm CMOS Technology Yeh, Kuo-Liang; Chang, Chih-Shiang; Guo, Jyh-Chyurn
國立交通大學 2018-01-24T07:38:13Z 奈米Si CMOS元件模型與參數萃取方法應用於包含佈局與應力工程效應之高頻模擬與雜訊分析 葉國良; 郭治群; Yeh, Kuo-Liang; Guo, Jyh-Chyurn
國立交通大學 2017-04-21T06:56:32Z A Comprehensive Characterization Method for Lateral Profiling of Interface Traps and Trapped Charges in P-SONOS Cell Devices Guo, Jyh-Chyurn; Du, Pei-Ying
國立交通大學 2017-04-21T06:50:04Z The Impact of Layout Dependent Effects on Mobility and Flicker Noise in Nanoscale Multifinger nMOSFETs for RF and Analog Design Guo, Jyh-Chyurn; Lo, Yi-Zen; Ou, Jyun-Rong

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