臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立高雄師範大學	2012	RF Stress Effects on CMOS LC-Loaded VCO Reliability Evaluated by Experiments	Ruey-Lue Wang;H. D. Yen;J. S. Yuan;Y. Y. Zhang;G. W. Huang;W. K. Yeh;F. S. Huang; 王瑞祿
國立高雄師範大學	2012	Experimental Verification of RF Stress Effect on Cascode Class E PA Performance and Reliability	Ruey-Lue Wang;J. S. Yuan;H. D. Yen;S. Chen;R. L. Wang;G. W. Huang;Y. Z. Juang;C. H. Tu;W. K. Yeh;J. Ma; 王瑞祿

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