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Institution	Date	Title	Author
中原大學	2001-12	應用可拓理論中優度評價法於半導體晶片測試之檢驗項目嚴重程度排序問題 Using Grade Judgement Method of Extension Theory to Get Effective Information Feedback for Testing Items in Semiconductor Testing Site	沈育樹;侯廷俊;宮大川;Shum, Yu-Su;Ho, Ting-Chun;Gong, Dah-Chuan

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