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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:44:13Z Characterization of hot-hole injection induced SILC and related disturbs in flash memories Yih, CM; Ho, ZH; Liang, MS; Chung, SS
國立交通大學 2014-12-08T15:26:55Z N-channel versus P-channel flash EEPROM - Which one has better reliabilities Chung, SS; Liaw, ST; Yih, CM; Ho, ZH; Lin, CJ; Kuo, DS; Liang, MS

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