|
English
|
正體中文
|
简体中文
|
2832010
|
|
???header.visitor??? :
33637429
???header.onlineuser??? :
875
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"hsia harry"???jsp.browse.items-by-author.description???
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立成功大學 |
2009-08 |
New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate
|
Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Yang, Sheng-Jier; Sheu, Yi-Ming; Hsia, Harry |
國立成功大學 |
2009-04 |
Narrow Width and Length Dependence of SiGe and Sallow-Trench-Isolation Stress Induced Defects in 45 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Strained SiGe Source/Drain
|
Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Sheu, Yi-Ming; Hsia, Harry; Chen, Wei-Ming; Lin, Shyue-Shyh; Hou, Chin-Shan |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
|