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Institution Date Title Author
國立交通大學 2014-12-08T15:27:03Z Auger recombination enhanced hot carrier degradation in nMOSFETs with positive substrate bias Chiang, LP; Tsai, CW; Wang, T; Liu, UC; Wang, MC; Hsia, LC
國立交通大學 2014-12-08T15:26:57Z Valence-band tunneling enhanced hot carrier degradation in ultra-thin oxide nMOSFETs Tsai, CW; Gu, SH; Chiang, LP; Wang, TH; Liu, YC; Huang, LS; Wang, MC; Hsia, LC

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