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亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
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劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng; |
育達商業科技大學 |
2011 |
Automated SMD LED Inspection Using Machine Vision
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Der-Baau , Perng;彭, 德保;Hsiao-Wei , Liu;Ching-Ching , Chang |
育達商業科技大學 |
2011 |
Backlit Mouse Defect Inspection Using Machine Vision
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Der-Baau , Perng;彭, 德保;Po-An , Chen;Hsiao-Wei , Liu |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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