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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T05:58:37Z |
An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET
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Hsieh, E. Ray; Jiang, Meng-Ru; Lin, Jian-Li; Chung, Steve S.; Chen, Tse Pu; Huang, Shih An; Chen, Tai-Ju; Cheng, Osbert |
| 國立交通大學 |
2018-08-21T05:57:09Z |
The Impact of TiN Barrier on the NBTI in an Advanced High-k Metal-gate p-channel MOSFET
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Huang, D. -C.; Hsieh, E. Ray; Gong, J.; Huang, C. -F.; Chung, Steve S. |
| 國立交通大學 |
2018-08-21T05:53:03Z |
A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path
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Hsieh, E. Ray; Kuo, Yen Chen; Cheng, Chih-Hung; Kuo, Jing Ling; Jiang, Meng-Ru; Lin, Jian-Li; Chen, Hung-Wen; Chung, Steve S.; Liu, Chuan-Hsi; Chen, Tse Pu; Huang, Shih An; Chen, Tai-Ju; Cheng, Osbert |
| 國立交通大學 |
2018-01-24T07:43:25Z |
三維電晶體由製程與長時間操作導致電特性變異 之多面向探討
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謝易叡; 莊紹勳; Hsieh, E-Ray; Chung, Steve |
Showing items 1-4 of 4 (1 Page(s) Totally)
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