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"hsieh shih an"
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| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV.
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Shih, Chi-Jih;Hsieh, Shih-An;Lu, Yi-Chang;Li, James Chien-Mo;Wu, Tzong-Lin;Chakrabarty, Krishnendu; Shih, Chi-Jih; Hsieh, Shih-An; Lu, Yi-Chang; Li, James Chien-Mo; Wu, Tzong-Lin; Chakrabarty, Krishnendu; CHIEN-MO LI |
| 國立臺灣大學 |
2014 |
DR-scan: 針對雙軌非同步電路的測試技術
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謝詩安; Hsieh, Shih-An |
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