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Showing items 1-25 of 45 (2 Page(s) Totally)
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| 國立交通大學 |
2018-08-21T05:54:16Z |
Impact of repeated uniaxial mechanical strain on flexible a-IGZO thin film transistors with symmetric and asymmetric structures
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Liao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Bo-Wei; Chen, Li-Hui; Hsieh, Tien-Yu; Yang, Chung-Yi; Chang, Kuan-Chang; Zhang, Sheng-Dong; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan |
| 國立交通大學 |
2018-08-21T05:54:05Z |
The effect of device electrode geometry on performance after hot-carrier stress in amorphous In-Ga-Zn-O thin film transistors with different via-contact structures
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Liao, Po-Yung; Chang, Ting-Chang; Chen, Yu-Jia; Su, Wan-Ching; Chen, Bo-Wei; Chen, Li-Hui; Hsieh, Tien-Yu; Yang, Chung-Yi; Chang, Kuan-Chang; Zhang, Sheng-Dong; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan |
| 國立交通大學 |
2018-08-21T05:53:58Z |
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors (vol 110, 103502, 2017)
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Su, Wan-Ching; Chang, Ting-Chang; Liao, Po-Yung; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-I; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; Chang, Kuan-Chang; Tsai, Tsung-Ming |
| 國立交通大學 |
2018-08-21T05:53:53Z |
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors
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Su, Wan-Ching; Chang, Ting-Chang; Liao, Po-Yung; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-I; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; Chang, Kuan-Chang; Tsai, Tsung-Ming |
| 國立交通大學 |
2017-04-21T06:56:08Z |
Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In-Ga-Zn-O thin-film transistors
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Liao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-Yi; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan |
| 國立交通大學 |
2017-04-21T06:49:55Z |
Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen |
| 國立成功大學 |
2016-12 |
Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In-Ga-Zn-O thin-film transistors
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Liao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-Yi; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan |
| 國立成功大學 |
2016-03-31 |
Investigating degradation behavior of hole-trapping effect under static and dynamic gate-bias stress in a dual gate a-InGaZnO thin film transistor with etch stop layer
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Liao, Po-Yung; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chang, Jung-Fang |
| 國立成功大學 |
2015-09 |
Investigation of carrier transport behavior in amorphous indium-gallium-zinc oxide thin film transistors
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Liao, Po-Yung; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Bo-Wei; Tu, Yi-Hsien; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chang, Jung-Fang |
| 國立交通大學 |
2015-07-21T11:20:53Z |
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang |
| 國立交通大學 |
2015-07-21T11:20:23Z |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
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Liu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2015-05-04 |
Impact of repeated uniaxial mechanical strain on p-type flexible polycrystalline thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Chen, Bo-Yao; Tu, Yi-Hsien; Lin, Yuan-Yao; Tsai, Wu-Wei; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:47:37Z |
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
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Chen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:35:54Z |
Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Chou, Wu-Ching; Chu, Ann-Kuo; Sze, Simon M.; Yeh, Bo-Liang |
| 國立交通大學 |
2014-12-08T15:35:26Z |
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:45Z |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:42Z |
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu |
| 國立交通大學 |
2014-12-08T15:31:03Z |
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:30:12Z |
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng |
| 國立交通大學 |
2014-12-08T15:28:53Z |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立成功大學 |
2014-12-01 |
Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2014-12-01 |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
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Liu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung |
Showing items 1-25 of 45 (2 Page(s) Totally)
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