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"hsieh tien yu"的相關文件
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| 國立成功大學 |
2013-09 |
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Tsai, Chih-Tsung; Chen, Shih-Ching; Lin, Chia-Sheng; Jian, Fu-Yen |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-07-01 |
High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Chen, Te-Chih; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-05 |
Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang |
| 國立成功大學 |
2013-05 |
Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang |
| 國立成功大學 |
2013-01-15 |
Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te |
| 國立成功大學 |
2013-01-15 |
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Chen, Yu-Te; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu |
| 國立成功大學 |
2012-11-26 |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
| 國立成功大學 |
2012-11-19 |
Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Chen, Yu-Chun; Chen, Yu-Te; Liao, Po-Yung; Chu, Ann-Kuo; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2012-07-23 |
Self-heating enhanced charge trapping effect for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 國立成功大學 |
2012-06-04 |
Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 高雄醫學大學 |
2012 |
Prevalence of and risk factors for musculoskeletal complaints among Taiwaneses dentists. Running tile: Musculoskeltal disorders among dentists.
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林子賢;劉彥君;謝天渝;Hsiao, Fenf-Ying;Lai, Yi-Chen;張進順; Lin, Tzu-Hsien;Liu, Yen-chun;Hsieh, Tien-Yu;Hsiao, Fenf-Ying;Lai, Yi-Chen;Chang, Chin-Shun |
| 國立臺中教育大學 |
2011 |
階層式試題反應理論模式及其等化估計方法
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謝典佑; Hsieh, Tien-Yu |
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