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"hsieh tien yu"的相关文件
显示项目 6-45 / 45 (共1页)
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| 國立交通大學 |
2017-04-21T06:49:55Z |
Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen |
| 國立成功大學 |
2016-12 |
Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In-Ga-Zn-O thin-film transistors
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Liao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-Yi; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan |
| 國立成功大學 |
2016-03-31 |
Investigating degradation behavior of hole-trapping effect under static and dynamic gate-bias stress in a dual gate a-InGaZnO thin film transistor with etch stop layer
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Liao, Po-Yung; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chang, Jung-Fang |
| 國立成功大學 |
2015-09 |
Investigation of carrier transport behavior in amorphous indium-gallium-zinc oxide thin film transistors
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Liao, Po-Yung; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Bo-Wei; Tu, Yi-Hsien; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chang, Jung-Fang |
| 國立交通大學 |
2015-07-21T11:20:53Z |
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang |
| 國立交通大學 |
2015-07-21T11:20:23Z |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
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Liu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2015-05-04 |
Impact of repeated uniaxial mechanical strain on p-type flexible polycrystalline thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Chen, Bo-Yao; Tu, Yi-Hsien; Lin, Yuan-Yao; Tsai, Wu-Wei; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:47:37Z |
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
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Chen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:35:54Z |
Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Chou, Wu-Ching; Chu, Ann-Kuo; Sze, Simon M.; Yeh, Bo-Liang |
| 國立交通大學 |
2014-12-08T15:35:26Z |
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:45Z |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:42Z |
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu |
| 國立交通大學 |
2014-12-08T15:31:03Z |
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:30:12Z |
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng |
| 國立交通大學 |
2014-12-08T15:28:53Z |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立成功大學 |
2014-12-01 |
Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2014-12-01 |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
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Liu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2014-12-01 |
Anomalous degradation behaviors under illuminated gate bias stress in a-Si:H thin film transistor
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Lin, Kun-Yao; Wu, Yi-Chun; Huang, Shih-Feng; Chiang, Cheng-Lung; Chen, Po-Lin; Lai, Tzu-Chieh; Lo, Chang-Cheng; Lien, Alan |
| 國立成功大學 |
2014-10-21 |
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang |
| 國立成功大學 |
2014-03-31 |
Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Chou, Wu-Ching; Chu, Ann-Kuo; Sze, Simon M.; Yeh, Bo-Liang |
| 國立成功大學 |
2014-03-10 |
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching |
| 國立成功大學 |
2013-09-30 |
Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-09 |
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Tsai, Chih-Tsung; Chen, Shih-Ching; Lin, Chia-Sheng; Jian, Fu-Yen |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-07-01 |
High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Chen, Te-Chih; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-05 |
Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang |
| 國立成功大學 |
2013-05 |
Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang |
| 國立成功大學 |
2013-01-15 |
Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te |
| 國立成功大學 |
2013-01-15 |
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Chen, Yu-Te; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
|
Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu |
| 國立成功大學 |
2012-11-26 |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
| 國立成功大學 |
2012-11-19 |
Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Chen, Yu-Chun; Chen, Yu-Te; Liao, Po-Yung; Chu, Ann-Kuo; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2012-07-23 |
Self-heating enhanced charge trapping effect for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 國立成功大學 |
2012-06-04 |
Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Chung, Yi-Chen; Ting, Hung-Che; Chen, Chia-Yu |
| 高雄醫學大學 |
2012 |
Prevalence of and risk factors for musculoskeletal complaints among Taiwaneses dentists. Running tile: Musculoskeltal disorders among dentists.
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林子賢;劉彥君;謝天渝;Hsiao, Fenf-Ying;Lai, Yi-Chen;張進順; Lin, Tzu-Hsien;Liu, Yen-chun;Hsieh, Tien-Yu;Hsiao, Fenf-Ying;Lai, Yi-Chen;Chang, Chin-Shun |
| 國立臺中教育大學 |
2011 |
階層式試題反應理論模式及其等化估計方法
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謝典佑; Hsieh, Tien-Yu |
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