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Institution	Date	Title	Author
國立交通大學	2019-08-02T02:24:17Z	Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias Stresses	Yang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi

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	English \| 正體中文 \| 简体中文 \| 總筆數 :2856655
	造訪人次 : 53566352 線上人數 : 1140 教育部委託研究計畫計畫執行:國立臺灣大學圖書館