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"hsieh tong yu"
Showing items 1-9 of 9 (1 Page(s) Totally)
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| 國立成功大學 |
2014-12 |
Efficient LFSR Reseeding Based on Internal-Response Feedback
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu |
| 國立成功大學 |
2013-08 |
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Ang, Wee-Lung |
| 國立成功大學 |
2013-01 |
Counter-Based Output Selection for Test Response Compaction
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu; Wu, Yu-Hua |
| 國立成功大學 |
2012-11-22 |
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu |
| 國立成功大學 |
2012-05 |
Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement
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Lee, Kuen-Jong; Hsieh, Tong-Yu; Breuer, Melvin A. |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
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Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
| 國立成功大學 |
2011-06 |
An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement
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Hsieh, Tong-Yu; Lee, Kuen-Jong; Breuer, Melvin A. |
| 國立成功大學 |
2009-07-20 |
可有效提升良率之容誤技術理論與應用
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謝東佑; Hsieh, Tong-Yu |
| 國立成功大學 |
2008-03 |
An error rate based test methodology to support error-tolerance
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Hsieh, Tong-Yu; Lee, Kuen-Jong; Breuer, Melvin A. |
Showing items 1-9 of 9 (1 Page(s) Totally)
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