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Institution Date Title Author
臺大學術典藏 2022-01-03T08:01:27Z Multi-reflection structure and photo-electric device Tsung-Dar Cheng; Jen-You Chu; Ding-Zheng Lin; Yi-Ping Chen;  Jia-Han Li; Hsin-Hung Cheng; Ying-Yu Chang; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:26Z Photo-electric device with inverse pyramid shaped recesses Tsung-Dar Cheng; Jen-You Chu; Ding-Zheng Lin; Yi-Ping Chen;  Jia-Han Li; Hsin-Hung Cheng; Ying-Yu Chang; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:18Z Field enhancements and directivities of plasmonic interference nanostructures with two localized hot spots Hsin-Hung Cheng; Ying-Yu Chang;  Jia-Han Li; * Jen-You Chu; Ding-Zheng Lin; Yi-Ping Chen; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:17Z Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write Fu-Min Wang; Kuen-Yu Tsai;  Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:16Z Localized field enhancement and far field directivities of the specific nanostructures for surface-enhanced Raman scattering Hsin-Hung Cheng; Ying-Yu Chang; Jen-You Chu; Ding-Zheng Lin; Yi-Ping Chen;  Jia-Han Li*; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:15Z Optical metrology of shape-varying nano-patterned gratings by analyzing the scattering signals in their pupil images Yen-Min Lee;  Jia-Han Li*; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen;   Kuen-Yu Tsai; Alek C. Chen; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:14Z Localized charges in plasmonic inverted pyramidal nanostructures with the tips Shih-Wen Chen; Hsin-Hung Cheng; Ying-Yu Chang; Jen-You Chu; Ding-Zheng Lin; Ying-Ping Chen;  Jia-Han Li^*; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:14Z Characteristics of varied inverted pyramidal structures with tips on crystalline silicon solar cell Hsin-Hung Cheng; Tsung-Dar Cheng;  Jia-Han Li*; JIA-HAN LI
臺大學術典藏 2022-01-03T08:01:07Z Surface-enhanced Raman spectroscopy (SERS) of textured structures with anti-reflection by wet etching and island lithography Hsin-Chia Ho; Bo-Kai Chao; Hsin-Hung Cheng; Li-Wei Nien; Miin-Jang Chen; Tadaaki Nagao;  Jia-Han Li; Chun-Hway Hsueh*; JIA-HAN LI
臺大學術典藏 2018-09-10T15:00:24Z Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI
臺大學術典藏 2018-09-10T15:00:24Z Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI
臺大學術典藏 2018-09-10T15:00:24Z Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T15:00:24Z Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T08:46:33Z Optical metrology of shape-varying nano-patterned gratings by analyzing the scattering signals in their pupil images Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Alek C. Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T08:18:26Z Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write Fu-Min Wang;Kuen-Yu Tsai;Jia-Han Li;Alek C. Chen;Yen-Min Lee;Yu-Tian Shen;Hsin-Hung Cheng;Chieh-Hsiang Kuan; Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; KUEN-YU TSAI
臺大學術典藏 2018-09-10T08:18:26Z Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write Fu-Min Wang;Kuen-Yu Tsai;Jia-Han Li;Alek C. Chen;Yen-Min Lee;Yu-Tian Shen;Hsin-Hung Cheng;Chieh-Hsiang Kuan; Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; KUEN-YU TSAI
臺大學術典藏 2012-02 Electron-beam proximity effect model calibration for fabricating scatterometry calibration samples Chun-Hung Liu; Chih-Yu Chen; Hoi-Tou Ng; Kuen-Yu Tsai; Fu-Ming Wang; Chieh-Hsiung Kuan; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Alek C. Chen; Yu-Tian Shen; KUEN-YU TSAI; CHIEH-HSIUNG KUAN et al.

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