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| 國立臺灣大學 |
2002 |
Oxide roughness effect on tunneling current of MOS diodes
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Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Novel photodetectors using metal-oxide-silicon tunneling structures
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Hsu, B.C.; Liu, W.T.; Lin, C.H.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Oxide roughness enhanced reliability of MOS tunneling diodes
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Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W. |
| 國立臺灣大學 |
2001 |
A PMOS Tunneling Photodetector
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Hsu, B.-C.; Liu, C.W.; Liu, W.T.; Lin, C.-H. |
| 國立臺灣大學 |
2001 |
A Comprehensive Study of Gate Inversion Current of Metal-Oxide-Silicon Tunneling diodes
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Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W. |
| 國立臺灣大學 |
2000 |
A Novel Photodetector Using MOS Tunneling Structures
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Liu, C.W.; Liu, W.T.; Lee, M.H.; Kuo, W.S.; Hsu, B.C. |
| 國立臺灣大學 |
1994-01 |
Insertion-Reactions of Square-Planar Diorganoplatinum. 1. Scope and Mechanisms of Stereoselective Carbonylation, Decarbo
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Chen, Jwu-Ting; Yeh, Y. S.; Yang, C. S.; Tsai, F. Y.; Huang, G. L.; Hsu, B. C.; Huang, T. M.; Chen, Y. S.; Lee, G. H.; Cheng, M. C.; Wang, C. C.; Wang, Yu |
Showing items 31-37 of 37 (4 Page(s) Totally)
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