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Institution	Date	Title	Author
國立交通大學	2019-04-02T05:59:53Z	Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETs	Chen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan
真理大學	2018-06	新北市樹林體育園區運動課程服務品質、學員滿意度與忠誠度之研究	許哲華; HSU, CHE-HUA
國立成功大學	2015-09-10	Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO2 and ZrO2 nMOSFETs	Wu, San-Lein; Wang, Bo Chin; Lu, Yu-Ying; Tsai, Shih-Chang; Chen, Jone-Fang; Chang, Shoou-Jinn; Chang, Sheng-Po; Hsu, Che-Hua; Yang, Chih Wei; Chen, Cheng-Guo; Cheng, Osbert; Huang, Po-Chin
國立交通大學	2014-12-08T15:12:04Z	Effect of NH(3) Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETs	Chen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan
國立成功大學	2013-07	Low-Frequency Noise Characteristics for Various ZrO2-Added HfO2-Based 28-nm High-k/Metal-Gate nMOSFETs	Tsai, Shih Chang; Wu, San Lein; Wang, Bo Chin; Chang, Shoou Jinn; Hsu, Che Hua; Yang, Chih Wei; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert; Huang, Po Chin; Chen, Jone F.
國立成功大學	2013-02-01	Comparison of the Trap Behavior Between ZrO2 and HfO2 Gate Stack nMOSFETs by 1/f Noise and Random Telegraph Noise	Wang, Bo Chin; Wu, San Lein; Lu, Yu Ying; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Yang, Chih Wei; Chen, Cheng Guo; Cheng, Osbert; Huang, Po Chin
國立成功大學	2012-09-17	Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise	Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert
國立成功大學	2011-07-23	利用多層金屬調控功函數用於深次奈米高介電/金屬閘極金氧半電晶體的研究	許哲華; Hsu, Che-Hua
南開科技大學	2011	依據生理狀態資料進行運作控制之運動設備及其系統與方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 林士煥; LIN, SHIH HUAN; 徐澤華; HSU, CHE HUA; 陳立強; CHEN, LI CHIANG
南開科技大學	2011	具全球定位功能的網路門診預約系統及其方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 林士煥; LIN, SHIH HUAN; 陳立強; CHEN, LI CHIANG; 徐澤華; HSU, CHE HUA
南開科技大學	2011	個人飲食統計與監控系統及其方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 王嘉安; Wang, Chia-An; 陳立強; CHEN, LI CHIANG; 徐澤華; HSU, CHE HUA
南開科技大學	2011	個人飲食監控及管理系統及其方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 王嘉安; Wang, Chia-An; 陳立強; CHEN, LI CHIANG; 徐澤華; HSU, CHE HUA
南開科技大學	2011	提供多使用者取得身體狀態之系統及其方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 林士煥; LIN, SHIH HUAN; 徐澤華; HSU, CHE HUA; 陳立強; CHEN, LI CHIANG
南開科技大學	2011	遠距居家照護系統及其方法	柯鴻禧; Ko, Hong-His; 黃琪聰; HUANG, CHI TSUNG; 林聰吉; LIN, TSUNG CHI; 王嘉安; Wang, Chia-An; 徐澤華; HSU, CHE HUA; 陳立強; CHEN, LI CHIANG
國立高雄大學	2009-07	Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs	Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming
國立成功大學	2009-07	Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs	Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming
國立高雄大學	2008-10	Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology	Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學	2008-09-01	Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology	Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學	2007-09	CMOS dual-work-function engineering by using implanted Ni-FUSI	Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike
國立高雄大學	2007-05	Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學	2007-05	Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學	2007-04	Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90 nm complementary metal oxide semiconductor field effect transistor	Lin, Chien-Ting; Fang, Yean-Kuen; Lai, Chieh-Ming; Yeh, Wen-Kuan; Hsu, Che-Hua; Cheng, Li-Wei; Huang, Yao-Tsung; Ma, Guang Hwa
國立高雄大學	2007-02	A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學	2007-02	A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學	2006-12	Effect of silicon thickness on contact-etch-stop-layer-induced silicon/buried-oxide interface stress for partially depleted SOI	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike

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