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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"hsu chia yu"的相关文件
显示项目 81-90 / 131 (共14页)
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| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2012-12-02 |
Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing
|
Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu |
| 元智大學 |
2012-12-02 |
Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map
|
Hsu, Chia-Yu; Zhou, Z.-A. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
| 元智大學 |
2012-10-15 |
Intelligent Classification of Complicated Water Bin Map Patterns
|
Hsu, Chia-Yu; Lee, C; Chien, C.; Chen, W.; Tsai, Y.; Chung, C.; Jou, B. |
| 元智大學 |
2012-07 |
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
|
Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong |
| 元智大學 |
2012-07 |
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
|
Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong |
| 元智大學 |
2012-06-23 |
Manufacturing Intelligence Approach for Advanced Equipment Control and Production Control for Yield Enhancement and Operational Effectiveness
|
Hsu, Chia-Yu; Chien, C.; Chen, Y. |
| 元智大學 |
2012-05-29 |
Development of Decision Support System for House Evaluation and Purchasing
|
Hsu, Chia-Yu; Goh, Juaimin; Chang P.C. |
显示项目 81-90 / 131 (共14页)
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