| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-01-06 |
Manufacturing Intelligence for Semiconductor Yield Enhancement
|
Hsu, Chia-Yu |
| 東吳大學 |
2012 |
銀行效率與資本適足率的評估-應用Hybrid DEA
|
許家瑜; Hsu, Chia-yu |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2011-12-11 |
Manufacturing Intelligence for Determining Machine Subgroups to Enhance Yield in Semiconductor Manufacturing
|
Chien, C.; Hsu, Chia-Yu; Chen, Y.; Yeh, Y. |
| 元智大學 |
2011-10-14 |
Advanced Process Control for Semiconductor Yield Enhancement and Manufacturing Intelligence
|
Chen, Y.; Hsu, Chia-Yu; Chien, C. |
| 元智大學 |
2011-10-14 |
Manufacturing Intelligence for Analyzing Wafer Start Decisions under Demand Uncertainty
|
Yen, W.; Hsu, Chia-Yu; Chien, C. |
| 元智大學 |
2011-09 |
Optimizing Information Value for Supporting Production Decisions for Semiconductor Manufacturing
|
Chien, C.; Hsu, Chia-Yu; Chiou, Noah; Chien, C.; Hsin, W.; Lee, C.; Chien, J.; Wu, A. |
| 元智大學 |
2011-09 |
Optimizing Information Value for Supporting Production Decisions for Semiconductor Manufacturing
|
Chien, C.; Hsu, Chia-Yu; Chiou, Noah; Chien, C.; Hsin, W.; Lee, C.; Chien, J.; Wu, A. |
| 元智大學 |
2011-06 |
Manufacturing Intelligence and Feedback Control for Semiconductor Yield Enhancement
|
Hsu, Chia-Yu; Chien, C.; Chen, Y.; Chou, G. |
| 元智大學 |
2011-06 |
A Fault Detection and Classification Framework for Yield Enhancement in Semiconductor Manufacturing
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2011-02 |
Manufacturing Intelligence for Effective Chemical Vapor Deposition Clean Effect Compensation for Advanced Process Control
|
Lin, K.; Hsu, Chia-Yu; Chien, C.; Yeh, Y; Chien-liang Wen |
| 淡江大學 |
2011 |
Environmental racism, toxicology, and technology in Neal Stephenson's Zodiac
|
徐佳妤; Hsu, Chia-Yu |
