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機構	日期	題名	作者
元智大學	2013-12-12	Intelligent Decision Model of House Evaluation	Hsu, Chia-Yu; Julaimin Goh; Chang P.C.
元智大學	2013-12-07	半導體晶圓圖樣型辨識與良率提升	張景翔; 林子鈞; 胡立德; 蔡永健; Hsu, Chia-Yu
元智大學	2013-12-07	應用啟發式演算法求解貨物配櫃最佳化之研究	陳鈺玟; 林右千; 李嘉芸; 鍾佳琳; 何冠儀; Hsu, Chia-Yu
元智大學	2013-12-05	A Framework for Root Cause Detection in Batch Processing Manufacturing	Chien, Chen-Fu ; Chuang, Shih-Chung ; Hsu, Chia-Yu; Liu, Qiao-Wen
元智大學	2013-11-16	多目標粒子群演算法應用於晶粒尺寸設計最佳化之研究	邱仕彰; Hsu, Chia-Yu
國立成功大學	2013-09-04	持續軌跡運動下當肌肉疲勞時對肩膀共同收縮之影響	許'家毓; Hsu, Chia-Yu
元智大學	2013-02-27	Optimizing design of chip size to enhance wafer exposure effectiveness in semiconductor manufacturing	Hsu, Chia-Yu; Chiu, Shih-Chang
元智大學	2013-02-27	Performance Evaluation for the High-tech Industry of the Science Park - A Case Study of Hsinchu Science Park	Peng, J.-T.; Hsu, Chia-Yu
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2012-12-02	Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing	Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu
元智大學	2012-12-02	Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map	Hsu, Chia-Yu; Zhou, Z.-A.
元智大學	2012-12	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N.
元智大學	2012-12	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N.
元智大學	2012-10-15	Intelligent Classification of Complicated Water Bin Map Patterns	Hsu, Chia-Yu; Lee, C; Chien, C.; Chen, W.; Tsai, Y.; Chung, C.; Jou, B.
元智大學	2012-07	Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing	Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong
元智大學	2012-07	Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing	Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong
元智大學	2012-06-23	Manufacturing Intelligence Approach for Advanced Equipment Control and Production Control for Yield Enhancement and Operational Effectiveness	Hsu, Chia-Yu; Chien, C.; Chen, Y.
元智大學	2012-05-29	Development of Decision Support System for House Evaluation and Purchasing	Hsu, Chia-Yu; Goh, Juaimin; Chang P.C.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-01-06	Manufacturing Intelligence for Semiconductor Yield Enhancement	Hsu, Chia-Yu
東吳大學	2012	銀行效率與資本適足率的評估-應用Hybrid DEA	許家瑜; Hsu, Chia-yu
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.

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