| 元智大學 |
2013-12-12 |
Intelligent Decision Model of House Evaluation
|
Hsu, Chia-Yu; Julaimin Goh; Chang P.C. |
| 元智大學 |
2013-12-07 |
半導體晶圓圖樣型辨識與良率提升
|
張景翔; 林子鈞; 胡立德; 蔡永健; Hsu, Chia-Yu |
| 元智大學 |
2013-12-07 |
應用啟發式演算法求解貨物配櫃最佳化之研究
|
陳鈺玟; 林右千; 李嘉芸; 鍾佳琳; 何冠儀; Hsu, Chia-Yu |
| 元智大學 |
2013-12-05 |
A Framework for Root Cause Detection in Batch Processing Manufacturing
|
Chien, Chen-Fu ; Chuang, Shih-Chung ; Hsu, Chia-Yu; Liu, Qiao-Wen |
| 元智大學 |
2013-11-16 |
多目標粒子群演算法應用於晶粒尺寸設計最佳化之研究
|
邱仕彰; Hsu, Chia-Yu |
| 國立成功大學 |
2013-09-04 |
持續軌跡運動下當肌肉疲勞時對肩膀共同收縮之影響
|
許'家毓; Hsu, Chia-Yu |
| 元智大學 |
2013-02-27 |
Optimizing design of chip size to enhance wafer exposure effectiveness in semiconductor manufacturing
|
Hsu, Chia-Yu; Chiu, Shih-Chang |
| 元智大學 |
2013-02-27 |
Performance Evaluation for the High-tech Industry of the Science Park - A Case Study of Hsinchu Science Park
|
Peng, J.-T.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2012-12-02 |
Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing
|
Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu |
| 元智大學 |
2012-12-02 |
Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map
|
Hsu, Chia-Yu; Zhou, Z.-A. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
| 元智大學 |
2012-10-15 |
Intelligent Classification of Complicated Water Bin Map Patterns
|
Hsu, Chia-Yu; Lee, C; Chien, C.; Chen, W.; Tsai, Y.; Chung, C.; Jou, B. |
| 元智大學 |
2012-07 |
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
|
Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong |
| 元智大學 |
2012-07 |
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
|
Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong |
| 元智大學 |
2012-06-23 |
Manufacturing Intelligence Approach for Advanced Equipment Control and Production Control for Yield Enhancement and Operational Effectiveness
|
Hsu, Chia-Yu; Chien, C.; Chen, Y. |
| 元智大學 |
2012-05-29 |
Development of Decision Support System for House Evaluation and Purchasing
|
Hsu, Chia-Yu; Goh, Juaimin; Chang P.C. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-05 |
Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance
|
Hsu, Chia-Yu; Chien, C.; Lai, Y. |
| 元智大學 |
2012-05 |
Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory
|
Chien, C.; Hsu, Chia-Yu; Lin, S. |
| 元智大學 |
2012-01-06 |
Manufacturing Intelligence for Semiconductor Yield Enhancement
|
Hsu, Chia-Yu |
| 東吳大學 |
2012 |
銀行效率與資本適足率的評估-應用Hybrid DEA
|
許家瑜; Hsu, Chia-yu |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
| 元智大學 |
2012 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.; Hsu, Chia-Yu; Hsiao, C. |
