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機構	日期	題名	作者
元智大學	2013	emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2013	Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park	Chien, C.; Peng, J.; Hsu, Chia-Yu
元智大學	2013	Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole	Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學	2013	Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2012-12-02	Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing	Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu
元智大學	2012-12-02	Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map	Hsu, Chia-Yu; Zhou, Z.-A.
元智大學	2012-12	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N.
元智大學	2012-12	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N.
元智大學	2012-10-15	Intelligent Classification of Complicated Water Bin Map Patterns	Hsu, Chia-Yu; Lee, C; Chien, C.; Chen, W.; Tsai, Y.; Chung, C.; Jou, B.
元智大學	2012-07	Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing	Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong
元智大學	2012-07	Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing	Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong
元智大學	2012-06-23	Manufacturing Intelligence Approach for Advanced Equipment Control and Production Control for Yield Enhancement and Operational Effectiveness	Hsu, Chia-Yu; Chien, C.; Chen, Y.
元智大學	2012-05-29	Development of Decision Support System for House Evaluation and Purchasing	Hsu, Chia-Yu; Goh, Juaimin; Chang P.C.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-05	Main Branch Decision Tree Algorithm for Yield Enhancement with Class Imbalance	Hsu, Chia-Yu; Chien, C.; Lai, Y.
元智大學	2012-05	Manufacturing Intelligence to Forecast the Customer Order Behavior for Vendor Managed Inventory	Chien, C.; Hsu, Chia-Yu; Lin, S.
元智大學	2012-01-06	Manufacturing Intelligence for Semiconductor Yield Enhancement	Hsu, Chia-Yu
東吳大學	2012	銀行效率與資本適足率的評估-應用Hybrid DEA	許家瑜; Hsu, Chia-yu
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2012	Manufacturing intelligence to forecast and reduce semiconductor cycle time	Chien, C.; Hsu, Chia-Yu; Hsiao, C.
元智大學	2011-12-11	Manufacturing Intelligence for Determining Machine Subgroups to Enhance Yield in Semiconductor Manufacturing	Chien, C.; Hsu, Chia-Yu; Chen, Y.; Yeh, Y.
元智大學	2011-10-14	Advanced Process Control for Semiconductor Yield Enhancement and Manufacturing Intelligence	Chen, Y.; Hsu, Chia-Yu; Chien, C.
元智大學	2011-10-14	Manufacturing Intelligence for Analyzing Wafer Start Decisions under Demand Uncertainty	Yen, W.; Hsu, Chia-Yu; Chien, C.
元智大學	2011-09	Optimizing Information Value for Supporting Production Decisions for Semiconductor Manufacturing	Chien, C.; Hsu, Chia-Yu; Chiou, Noah; Chien, C.; Hsin, W.; Lee, C.; Chien, J.; Wu, A.
元智大學	2011-09	Optimizing Information Value for Supporting Production Decisions for Semiconductor Manufacturing	Chien, C.; Hsu, Chia-Yu; Chiou, Noah; Chien, C.; Hsin, W.; Lee, C.; Chien, J.; Wu, A.
元智大學	2011-06	Manufacturing Intelligence and Feedback Control for Semiconductor Yield Enhancement	Hsu, Chia-Yu; Chien, C.; Chen, Y.; Chou, G.
元智大學	2011-06	A Fault Detection and Classification Framework for Yield Enhancement in Semiconductor Manufacturing	Chien, C.; Hsu, Chia-Yu; Chen, P.
元智大學	2011-02	Manufacturing Intelligence for Effective Chemical Vapor Deposition Clean Effect Compensation for Advanced Process Control	Lin, K.; Hsu, Chia-Yu; Chien, C.; Yeh, Y; Chien-liang Wen
淡江大學	2011	Environmental racism, toxicology, and technology in Neal Stephenson's Zodiac	徐佳妤; Hsu, Chia-Yu

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