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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"hsu chia yu"的相關文件
顯示項目 71-80 / 131 (共14頁)
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| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
顯示項目 71-80 / 131 (共14頁)
<< < 3 4 5 6 7 8 9 10 11 12 > >>
每頁顯示[10|25|50]項目
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