|
English
|
正體中文
|
简体中文
|
Total items :0
|
|
Visitors :
52581105
Online Users :
742
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
|
|
|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"hsu chia yu"
Showing items 76-85 of 131 (14 Page(s) Totally)
<< < 3 4 5 6 7 8 9 10 11 12 > >>
View [10|25|50] records per page
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
| 元智大學 |
2012-12-02 |
Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing
|
Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu |
| 元智大學 |
2012-12-02 |
Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map
|
Hsu, Chia-Yu; Zhou, Z.-A. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
| 元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
|
Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
Showing items 76-85 of 131 (14 Page(s) Totally)
<< < 3 4 5 6 7 8 9 10 11 12 > >>
View [10|25|50] records per page
|
