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Showing items 21-30 of 73 (8 Page(s) Totally)
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| 國立臺灣科技大學 |
2014 |
The study of temperature dependent strain in Ge epilayer with SiGe/Ge buffer layer on Si substrate with different thickness
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Wu, P.-H.;Huang, Y.-S.;Hsu, H.-P.;Li, C.;Huang, S.-H.;Tiong, K.-K. |
| 國立臺灣科技大學 |
2014 |
Temperature dependence study of near-band-edge transitions of compressively strained quaternary GaAsPSb layer by photoreflectance and piezoreflectance spectroscopy
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Hsu, H.-P.;Wu, P.-H.;Chen, J.-Y.;Chen, B.-H.;Huang, Y.-S.;Chin, Y.-C.;Lin, H.-H.;Tiong, K.-K. |
| 國立臺灣科技大學 |
2014 |
Piezoreflectance study of near band edge excitonic-transitions of mixed-layered crystal Mo(SxSe1-x)2 solid solutions
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Wu, Y.J.;Wu, P.H.;Jadczak, J.;Huang, Y.S.;Ho, C.H.;Hsu, H.P.;Tiong, K.K. |
| 國立臺灣科技大學 |
2014 |
Composition dependent lattice dynamics in MoSxSe(2- x) alloys
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Jadczak, J.;Dumcenco, D.O.;Huang, Y.S.;Lin, Y.C.;Suenaga, K.;Wu, P.H.;Hsu, H.P.;Tiong, K.K. |
| 國立臺灣科技大學 |
2013 |
Photoreflectance spectroscopy characterization of Ge/Si0.16 Ge0.84 multiple quantum wells on Ge virtual substrate
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Hsu, H.-P.;Yang, P.-H.;Huang, J.-K.;Wu, P.-H.;Huang, Y.-S.;Li, C.;Huang, S.-H.;Tiong, K.-K. |
| 國立臺灣科技大學 |
2013 |
Characterization of Ge/Si0.16Ge0.84 multiple quantum wells on Ge-on-Si virtual substrate using piezoreflectance spectroscopy
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Wu, P.H.;Huang, Y.S.;Hsu, H.P.;Li, C.;Huang, S.H.;Tiong, K.K. |
| 國立臺灣科技大學 |
2013 |
Contactless electroreflectance and photoluminescence study of the sb surfactant effects on InGaAsN multiple quantum wells
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Hsu, H.P.;Huang, J.K.;Huang, Y.S.;Lin, D.Y.;Chen, W.C.;Su, Y.K. |
| 國立臺灣科技大學 |
2013 |
Temperature dependent surface photovoltage spectra of type i GaAs 1-xSbx/GaAs multiple quantum well structures
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Sitarek, P.;Misiewicz, J.;Huang, Y.S.;Hsu, H.P.;Tiong, K.K. |
| 國立臺灣科技大學 |
2012 |
Deposition and structural characterization of nanostructured RuO 2 on rutile-TiO 2/sapphire(100) templates by reactive radio frequency magnetron sputtering
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Chen, Y.M.;Yeh, C.N.;Chen, C.A.;Huang, Y.S.;Hsu, H.P.;Tsai, D.S.;Tiong, K.K. |
| 國立臺灣科技大學 |
2012 |
Optical characterization of Zn 0.35Cd 0.44Mg 0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
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Dumcenco, D.;Levcenco, S.;Huang, Y.-S.;Hsu, H.-P.;Firszt, F.;Tiong, K.-K. |
Showing items 21-30 of 73 (8 Page(s) Totally)
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