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Showing items 46-50 of 50 (2 Page(s) Totally)
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| 國立成功大學 |
2008-03-10 |
Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 mu m n-type lateral diffused metal-oxide-semiconductor transistors
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Lee, J. R.; Chen, Jone F.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L. |
| 國立成功大學 |
2007-11 |
OFF-state avalanche-breakdown-induced ON-resistance degradation in lateral DMOS transistors
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Chen, Jone-Fang; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M.; Hsu, S. L. |
| 國立成功大學 |
2006-10-30 |
Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors
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Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, K. W.; Shih, J. R.; Hsu, S. L. |
| 國立成功大學 |
2006-09 |
Anomalous reduction of hot-carrier-induced ON-resistance degradation in n-type DEMOS transistors
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Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, Y. C.; Hsu, S. L.; Shih, J. R. |
| 國立臺灣大學 |
2005-01 |
Problems and their frequency, and emotional disturbances and needs among nurses providing sexual health education.
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Tsai, L. Y.; Yao, G.; Hsu, S. L.; Hwang, S. L. |
Showing items 46-50 of 50 (2 Page(s) Totally)
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