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机构 日期 题名 作者
國立彰化師範大學 2010-10 Combine Pixel-Chaotic-Shuffle and Bit-Chaotic-Rearrangement in Image Encryption Nien, H. H. ; Huang, C. K. ; Hsu, S. L. ; Huang, Wei-Tzer
國立臺灣大學 2010 Magnetic properties and microstructures of sputtered epitaxial Co-rich Co-Pt films Chen, S.C.; Kuo, P.C.; Shen, C.L.; Hsu, S.L.; Sun, T.H.
國立成功大學 2008-05 Anomalous hot-caffier-induced increase in saturation-region drain current in n-type lateral diffused metal-oxide-semiconductor transistors Chen, Shiang-Yu; Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L.
國立成功大學 2008-04 An investigation on hot-carrier reliability and degradation index in lateral diffused metal-oxide-semiconductor field-effect transistors Tian, Kuen-Shiuan; Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Lee, J. R.; Huang, Tsung-Yi; Liu, C. A.; Hsu, S. L.
國立成功大學 2008-04 Effect of gate voltage on hot-carrier-induced on-resistance degradation in high-voltage n-type lateral diffused metal-oxide-semiconductor transistors Chen, Shiang-Yu; Chen, Jone F.; Wu, Kuo-Ming; Lee, J. R.; Liu, C. A.; Hsu, S. L.
國立成功大學 2008-03-10 Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 mu m n-type lateral diffused metal-oxide-semiconductor transistors Lee, J. R.; Chen, Jone F.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L.
國立成功大學 2007-11 OFF-state avalanche-breakdown-induced ON-resistance degradation in lateral DMOS transistors Chen, Jone-Fang; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M.; Hsu, S. L.
國立成功大學 2006-10-30 Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, K. W.; Shih, J. R.; Hsu, S. L.
國立成功大學 2006-09 Anomalous reduction of hot-carrier-induced ON-resistance degradation in n-type DEMOS transistors Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, Y. C.; Hsu, S. L.; Shih, J. R.
國立臺灣大學 2005-01 Problems and their frequency, and emotional disturbances and needs among nurses providing sexual health education. Tsai, L. Y.; Yao, G.; Hsu, S. L.; Hwang, S. L.

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