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"hsu tzu hsuan"的相关文件
显示项目 11-21 / 21 (共1页)
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| 國立成功大學 |
2005-08 |
An effective method to improve the sensitivity of deep submicrometer CMOS image sensors
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Lin, J. S.; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Wang, Chung-Shu; Chen, Shih-Fang; Lin, Chun-Yue; Lin, Chun-Sheng; Chou, Tse-Heng |
| 國立成功大學 |
2005-06-30 |
先進技術及新穎結構應用於高效能深次微米互補式金氧半影像感測元件之研究
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許慈軒; Hsu, Tzu-Hsuan |
| 國立成功大學 |
2005-06-30 |
先進技術及新穎結構應用於高效能深次微米互補式金氧半影像感測元件之研究
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許慈軒; Hsu, Tzu-Hsuan |
| 國立成功大學 |
2005-05 |
Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-/mu m CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, C. S.; Lin, J. S.; Tseng, C. H.; Chen, S. F.; Lin, C. S.; Lin, C. Y. |
| 國立成功大學 |
2004-01 |
Light guide for pixel crosstalk improvement in deep submicron CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Lin, C. Y.; Chen, S. F.; Lin, C. S.; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, C. H.; Lin, J. S.; Wang, C. S. |
| 國立成功大學 |
2003-06 |
AlGaN/GaN modulation-doped field-effect transistors with an Mg-doped carrier confinement layer
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Chang, Shoou-Jinn; Wei, Sun-Chin; Su, Yan-Kuin; Liu, Chun-Hsing; Chen, Shih-Chih; Liaw, Uang-Heay; Tsai, Tzong-Yow; Hsu, Tzu-Hsuan |
| 國立成功大學 |
2002-06-21 |
以電感耦合電漿蝕刻氮化鋁鎵調變摻雜場效電晶體的製作與研究
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徐子軒; Hsu, Tzu-Hsuan |
| 國立成功大學 |
2002-06-21 |
以電感耦合電漿蝕刻氮化鋁鎵調變摻雜場效電晶體的製作與研究
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徐子軒; Hsu, Tzu-Hsuan |
| 國立成功大學 |
2002-05 |
Downscaling limit of equivalent oxide thickness in formation of ultrathin gate dielectric by thermal-enhanced remote plasma nitridation
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Chen, Chien-Hao; Fang, Yean-Kuen; Ting, Shyh-Fann; Hsieh, Wen-Tse; Yang, Chih-Wei; Hsu, Tzu-Hsuan; Yu, Mo-Chiun; Lee, Tze-Liang; Chen, Shih-Chang; Yu, Chen-Hua; Liang, Mong-Song |
显示项目 11-21 / 21 (共1页)
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