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Institution	Date	Title	Author
臺北醫學大學	2005	Barrier capability of Hf-N films with various nitrogen concentrations against copper diffusion in Cu/Hf-N/n+-p junction diodes	歐耿良; Ou,Keng-Liang; Chiou,Shi-Yung; Lin,Ming-Hongn; Hsud,Ray-Quan

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