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Taiwan Academic Institutional Repository >
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"huang chen shuo"
Showing items 1-13 of 13 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T05:58:57Z |
Effect of high-pressure H2O treatment on elimination of interfacial GeOX layer between ZrO2 and Ge stack
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Huang, Chen-Shuo; Liu, Po-Tsun |
| 國立交通大學 |
2018-08-21T05:53:12Z |
Abnormal Dual Channel Formation Induced by Hydrogen Diffusion From SiNx Interlayer Dielectric in Top Gate a-InGaZnO Transistors
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Chen, Guan-Fu; Chang, Ting-Chang; Chen, Hua-Mao; Chen, Bo-Wei; Chen, Hong-Chih; Li, Cheng-Ya; Tai, Ya-Hsiang; Hung, Yu-Ju; Chang, Kuo-Jui; Cheng, Kai-Chung; Huang, Chen-Shuo; Chen, Kuo-Kuang; Lu, Hsueh-Hsing; Lin, Yu-Hsin |
| 國立交通大學 |
2014-12-16T06:14:57Z |
METHOD FOR REMOVING GERMANIUM SUBOXIDE
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Liu Po-Tsun; Huang Chen-Shuo |
| 國立交通大學 |
2014-12-16T06:14:17Z |
Method for forming an interfacial passivation layer on the Ge semiconductor
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Liu Po-Tsun; Huang Chen-Shuo; Huang Yi-Ling; Cheng Szu-Lin; Sze Simon M.; Nishi Yoshio |
| 國立交通大學 |
2014-12-16T06:13:52Z |
Method for removing germanium suboxide
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Liu Po-Tsun; Huang Chen-Shuo |
| 國立交通大學 |
2014-12-12T01:40:49Z |
閘極介電層於矽通道與鍺通道金氧半場效電晶體之研究
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黃震鑠; Huang, Chen-Shuo; 劉柏村; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:37:52Z |
Impact of Negative-Bias-Temperature-Instability on Channel Bulk of Polysilicon TFT by Gated PIN Diode Analysis
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Huang, Chen-Shuo; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:27:53Z |
Effect of high-pressure H(2)O treatment on elimination of interfacial GeO(X) layer between ZrO(2) and Ge stack
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Huang, Chen-Shuo; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:12:42Z |
Modeling of nitrogen profile effects on direct tunneling probability in ultrathin nitrided oxides
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Liu, Po-Tsun; Huang, Chen-Shuo; Lee, D. Y.; Lim, P. S.; Lin, S. W.; Chen, C. C.; Tao, H. J.; Mii, Y. J. |
| 國立交通大學 |
2014-12-08T15:12:09Z |
Spin-on ZnO thin film transistors with oxidation treatment
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Huang, Chen-Shuo; Chou, Yi-Teh; Liu, Po-Tsun; Chung, Wan-Fang; Huang, Chien-Jui |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Investigation on thin-film-transistors with a transparent material Zinc-Oxide layer with DC sputter deposition system
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Chou, Yi-Teh; Huang, Chen-Shuo; Shiau, S. J.; Liu, Po-Tsun; Chu, Li-wei |
| 國立交通大學 |
2014-12-08T15:10:43Z |
Anomalous Gate-Edge Leakage Induced by High Tensile Stress in NMOSFET
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Liu, Po-Tsun; Huang, Chen-Shuo; Lim, Peng-Soon; Lee, Da-Yuan; Tsao, Shueh-Wen; Chen, Chi-Chun; Tao, Hun-Jan; Mii, Yuh-Jier |
| 國立交通大學 |
2014-12-08T15:07:15Z |
Effects of postgate dielectric treatment on germanium-based metal-oxide-semiconductor device by supercritical fluid technology
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Liu, Po-Tsun; Huang, Chen-Shuo; Huang, Yi-Ling; Lin, Jing-Ru; Cheng, Szu-Lin; Nishi, Yoshio; Sze, S. M. |
Showing items 1-13 of 13 (1 Page(s) Totally)
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