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"huang cheng tung"的相关文件
显示项目 41-51 / 51 (共2页)
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| 國立成功大學 |
2014-12-01 |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
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Liu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2014-10-06 |
Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks
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Tsai, Jyun-Yu; Chang, Ting-Chang; Chen, Ching-En; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen |
| 國立成功大學 |
2013-11-07 |
High-k shallow traps observed by charge pumping with varying discharging times
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Ho, Szu-Han;Chang, Ting-Chang;Lu, Ying-Hsin;Wang, Bin-Wei;Lo, Wen-Hung;Chen, Ching-En;Tsai, Jyun-Yu;Chen, Hua-Mao;Liu, Kuan-Ju;Tseng, Tseung-Yuen;Cheng, Osbert;Huang, Cheng-Tung;Chen, Tsai-Fu;Cao, Xi-Xin |
| 國立成功大學 |
2013-09-28 |
Abnormal threshold voltage shift under hot carrier stress in Ti1-xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors
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Tsai, Jyun-Yu;Chang, Ting-Chang;Lo, Wen-Hung;Ho, Szu-Han;Chen, Ching-En;Chen, Hua-Mao;Tseng, Tseung-Yuen;Tai, Ya-Hsiang;Cheng, Osbert;Huang, Cheng-Tung |
| 國立成功大學 |
2013-07-08 |
Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors
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Tsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2013-02-18 |
Hole injection-reduced hot carrier degradation in n-channel metal-oxide-semiconductor field-effect-transistors with high-k gate dielectric
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Tsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2013 |
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M. |
| 國立成功大學 |
2012-09-24 |
Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistors
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Lo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2012-04-09 |
Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress
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Lo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2011-05 |
Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Hung, Chin-Kai; Wang, Tzu-Juei; Kuo, Cheng-Wen; Huang, Cheng-Tung; Cheng, Osbert |
| 朝陽科技大學 |
2008-12-31 |
退休需求對投資型保險購買行為之研究
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黃正棟; Huang, Cheng-Tung |
显示项目 41-51 / 51 (共2页)
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