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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立成功大學 |
2018-06-28 |
聚醯胺聚合物在高速撞擊下之塑性變形行為與破壞分析
|
黃嘉泓; Huang, Chia-Hong |
| 國立成功大學 |
2018-06-28 |
聚醯胺聚合物在高速撞擊下之塑性變形行為與破壞分析
|
黃嘉泓; Huang, Chia-Hong |
| 國立臺灣大學 |
2005 |
The effect of photon illumination in rapid thermal processing on the characteristics of MOS structures with ultra-thin oxides examined by substrate injection
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Effect of Mechanical Stress on Characteristics of Silicon Thermal Oxides
|
Yen, Jui-Yuan; Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Anomalous low-voltage tunneling current characteristics of ultrathin gate oxide (~2 nm) after high-field stress
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Breakdown characteristics of ultrathin gate oxides (<4 nm) in metal–oxide–semiconductor structure subjected to substrate injection
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2000 |
Enhancement in soft breakdown occurrence of ultra-thin gate oxides caused by photon effect in rapid thermal post-oxidation annealing
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
Showing items 1-7 of 7 (1 Page(s) Totally)
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