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Taiwan Academic Institutional Repository >
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"huang cm"
Showing items 61-70 of 134 (14 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:18:15Z |
New triple self-aligned (SA3) split-gate flash cell with T-shaped source coupling
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Sung, HC; Lei, TF; Huang, CM; Kao, YC; Lin, YT; Wang, CS |
| 國立交通大學 |
2014-12-08T15:16:40Z |
Charge-orbital ordering of magnetite studied by soft resonant X-ray scattering
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Chao, KS; Huang, DJ; Lin, HJ; Okamoto, J; Hsu, CH; Huang, CM; Wu, WB; Chen, CT |
| 國立交通大學 |
2014-12-08T15:04:44Z |
MODELING HOT-ELECTRON GATE CURRENT IN SI MOSFETS USING A COUPLED DRIFT-DIFFUSION AND MONTE-CARLO METHOD
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HUANG, CM; WANG, TH; CHEN, CN; CHANG, MC; FU, J |
| 國立交通大學 |
2014-12-08T15:04:18Z |
DEVICE AND CIRCUIT SIMULATION OF ANOMALOUS DX TRAP EFFECTS IN DCFL AND SCFL HEMT INVERTERS
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WANG, TH; WU, SJ; HUANG, CM |
| 國立交通大學 |
2014-12-08T15:04:14Z |
TERRAIN EXPLORATION OF A SENSOR-BASED ROBOT MOVING AMONG UNKNOWN OBSTACLES OF POLYGONAL SHAPE
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CHEN, Z; HUANG, CM |
| 國立交通大學 |
2014-12-08T15:03:47Z |
EFFECTS OF HOT-CARRIER-INDUCED INTERFACE STATE GENERATION IN SUBMICRON LDD MOSFETS
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WANG, TH; HUANG, CM; CHOU, PC; CHUNG, SSS; CHANG, TE |
| 國立交通大學 |
2014-12-08T15:03:40Z |
INTERFACE-TRAP EFFECT ON GATE INDUCED DRAIN LEAKAGE CURRENT IN SUBMICRON N-MOSFETS
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WANG, TH; HUANG, CM; CHANG, TE; CHOU, JW; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:03:33Z |
TRANSIENT SIMULATION OF EPROM WRITING CHARACTERISTICS, WITH A NOVEL HOT-ELECTRON INJECTION MODEL
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HUANG, CM; WANG, TH |
| 國立交通大學 |
2014-12-08T15:03:27Z |
MECHANISMS OF INTERFACE TRAP-INDUCED DRAIN LEAKAGE CURRENT IN OFF-STATE N-MOSFETS
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CHANG, TE; HUANG, CM; WANG, TH |
| 國立交通大學 |
2014-12-08T15:03:02Z |
STRUCTURAL EFFECT ON BAND-TRAP-BAND TUNNELING INDUCED DRAIN LEAKAGE IN N-MOSFETS
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WANG, TH; CHANG, TE; HUANG, CM; YANG, JY; CHANG, KM; CHIANG, LP |
Showing items 61-70 of 134 (14 Page(s) Totally)
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