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| 國立交通大學 |
2018-08-21T05:57:09Z |
The Impact of TiN Barrier on the NBTI in an Advanced High-k Metal-gate p-channel MOSFET
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Huang, D. -C.; Hsieh, E. Ray; Gong, J.; Huang, C. -F.; Chung, Steve S. |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Dimensional Dependences of the Dynamic-NBTI with 1.2 nm N20-ISSG oxynitrides
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Lai, Chao Sung; Huang, D. C.; Chung, S. S. |
| 國立交通大學 |
2014-12-08T15:45:53Z |
More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability
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Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:24:57Z |
New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond
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Chung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 亞洲大學 |
2008-10 |
Design a Support Vector Machine-based Intelligent System for Vehicle Driving Safety Warning
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林哲聰;Lin, C.W;Huang, D.C.;陳永信;Chen*, Yung-Hsin |
| 國立成功大學 |
2002-08 |
An efficient BIST method for distributed small buffers
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Jone, W. B.; Huang, D. C.; Wu, S. C.; Lee, Kuen-Jong |
| 淡江大學 |
2000-02 |
Positron spectroscopy of base-adsorbed Y-zeolite
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Huang, W. F.; Hung, K. J.; Huang, D. C.; Huang, C. C.; Tseng, P. K. |
| 淡江大學 |
1998-01 |
Effect of Ag-promotion on Pd catalysts by XANES
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Huang, D.C.; Chang, K.H.; Pong, W.F.; Tseng, P.K.; Hung, K.J.; Huang, W.F. |
| 淡江大學 |
1997 |
Brönsted Acidity in Y-Zeolites by 2D-ACAR
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Hung, J. K.; Huang, C. C.; Huang, D. C.; Tseng, P. K.; Huang, W. F. |
Showing items 11-19 of 19 (1 Page(s) Totally)
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