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"huang fon shan"的相關文件
顯示項目 1-10 / 14 (共2頁) 1 2 > >> 每頁顯示[10|25|50]項目
| 國立交通大學 |
2019-04-02T06:00:56Z |
Application of Supercritical CO2 Fluid for Dielectric Improvement of SiOx Film
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Tsai, Chih-Tsung; Chang, Ting-Chang; Liu, Po-Tsun; Cheng, Yi-Li; Kin, Kon-Tsu; Huang, Fon-Shan |
| 國立交通大學 |
2019-04-02T05:59:53Z |
Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETs
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Chen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan |
| 國立交通大學 |
2019-04-02T05:59:43Z |
Impact of Highly Compressive Interlayer-Dielectric-SiNx Stressing Layer on 1/f Noise and Reliability of SiGe-Channel pMOSFETs
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Chen, Yu-Ting; Chen, Kun-Ming; Liao, Wen-Shiang; Huang, Guo-Wei; Huang, Fon-Shan |
| 國立交通大學 |
2019-04-02T05:58:54Z |
High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO2 Pellets for the Nonvolatile Memory Device Application
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Hu, Chih-Wei; Chang, Ting-Chang; Tu, Chun-Hao; Huang, Yu-Hao; Lin, Chao-Cheng; Chen, Min-Chen; Huang, Fon-Shan; Sze, Simon M.; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:47:37Z |
Impact of Highly Compressive Interlayer-Dielectric-SiN(x) Stressing Layer on 1/f Noise and Reliability of SiGe-Channel pMOSFETs
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Chen, Yu-Ting; Chen, Kun-Ming; Liao, Wen-Shiang; Huang, Guo-Wei; Huang, Fon-Shan |
| 國立交通大學 |
2014-12-08T15:13:40Z |
Low-temperature method for enhancing sputter-deposited HfO2 films with complete oxidization
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Tsai, Chih-Tsung; Chang, Ting-Chang; Liu, Po-Tsun; Yang, Po-Yu; Kuo, Yu-Chieh; Kin, Kon-Tsu; Chang, Pei-Lin; Huang, Fon-Shan |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Effect of NH(3) Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-kappa Dielectric nMOSFETs
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Chen, Yu-Ting; Chen, Kun-Ming; Lin, Cheng-Li; Yeh, Wen-Kuan; Huang, Guo-Wei; Lai, Chien-Ming; Chen, Yi-Wen; Hsu, Che-Hua; Huang, Fon-Shan |
| 國立交通大學 |
2014-12-08T15:11:03Z |
Low temperature improvement on silicon oxide grown by electron-gun evaporation for resistance memory applications
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Tsai, Chih-Tsung; Chang, Ting-Chang; Liu, Po-Tsun; Cheng, Yi-Li; Huang, Fon-Shan |
| 國立交通大學 |
2014-12-08T15:10:28Z |
Application of Supercritical CO(2) Fluid for Dielectric Improvement of SiO(x) Film
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Tsai, Chih-Tsung; Chang, Ting-Chang; Liu, Po-Tsun; Cheng, Yi-Li; Kin, Kon-Tsu; Huang, Fon-Shan |
| 國立交通大學 |
2014-12-08T15:07:53Z |
High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO(2) Pellets for the Nonvolatile Memory Device Application
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Hu, Chih-Wei; Chang, Ting-Chang; Tu, Chun-Hao; Huang, Yu-Hao; Lin, Chao-Cheng; Chen, Min-Chen; Huang, Fon-Shan; Sze, Simon M.; Tseng, Tseung-Yuen |
顯示項目 1-10 / 14 (共2頁) 1 2 > >> 每頁顯示[10|25|50]項目
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