|
"huang gw"的相關文件
顯示項目 6-15 / 77 (共8頁) 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:45:02Z |
Effect of coplanar probe pad design on noise figures of 0.35 mu m MOSFETs
|
Su, CY; Chen, LP; Chang, SJ; Huang, GW; Ho, YP; Tseng, BM; Lin, DC; Lee, HY; Kuan, JF; Deng, YM; Chen, CL; Leu, LY; Wen, KA; Chang, CY |
| 國立交通大學 |
2014-12-08T15:44:56Z |
Study on Ge/Si ratio, silicidation, and strain relaxation of high temperature sputtered Co/Si1-xGex structures
|
Huang, HJ; Chen, KM; Chang, CY; Huang, TY; Chen, LP; Huang, GW |
| 國立交通大學 |
2014-12-08T15:44:54Z |
Reduction of source/drain series resistance and its impact on device performance for PMOS transistors with raised Si1-xGex source/drain
|
Huang, HJ; Chen, KM; Chang, CY; Chen, LP; Huang, GW; Huang, TY |
| 國立交通大學 |
2014-12-08T15:44:34Z |
Improved electrical properties of shallow p(+)-n junction using selectively grown graded Si1-xGex epitaxial structure
|
Huang, HJ; Chen, KM; Chang, CY; Huang, TY; Chen, LP; Huang, GW |
| 國立交通大學 |
2014-12-08T15:44:07Z |
The reaction of Co and Si1-xGex for MOSFET with poly-Si1-xGex gate
|
Chen, KM; Huang, HJ; Chang, CY; Huang, TY; Huang, GW; Chen, LP |
| 國立交通大學 |
2014-12-08T15:43:36Z |
Improved low temperature characteristics of p-channel MOSFETs with Si1-xGex raised source and drain
|
Huang, HJ; Chen, KM; Huang, TY; Chao, TS; Huang, GW; Chien, CH; Chang, CY |
| 國立交通大學 |
2014-12-08T15:43:21Z |
An automatic macro program for radio frequency MOSFET characteristics analysis
|
Su, CY; Chang, SJ; Chen, LP; Ho, YP; Huang, GW; Lin, DC; Tseng, BM; Lee, HY; Kuan, JF; Deng, YM; Wen, KA; Chang, CY |
| 國立交通大學 |
2014-12-08T15:42:30Z |
A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurement
|
Lue, HT; Tseng, TY; Huang, GW |
| 國立交通大學 |
2014-12-08T15:42:25Z |
A macro model of silicon spiral inductor
|
Su, CY; Chen, LP; Chang, SJ; Tseng, BM; Lin, DC; Huang, GW; Ho, YP; Lee, HY; Kuan, JF; Wen, WY; Liou, P; Chen, CL; Leu, LY; Wen, KA; Chang, CY |
| 國立交通大學 |
2014-12-08T15:41:56Z |
Analysis of low-frequency noise in boron-doped polycrystalline silicon-germanium resistors
|
Chen, KM; Huang, GW; Chiu, DY; Huang, HJ; Chang, CY |
顯示項目 6-15 / 77 (共8頁) 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
|