English  |  正體中文  |  简体中文  |  Total items :0  
Visitors :  53280594    Online Users :  1021
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

"huang gw"

Return to Browse by Author
Sorting by Title Sort by Date

Showing items 31-40 of 77  (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page

Institution Date Title Author
國立交通大學 2014-12-08T15:26:10Z A high isolation CMFB downconversion micromixer using 0. 18-urn deep N-well CMOS technology Meng, CC; Xu, SK; Wu, TH; Chao, MH; Huang, GW
國立交通大學 2014-12-08T15:26:10Z A fully integrated 5.2 GHz GaInP/GaAs HBT upconversion micromixer with output LC current combiner and oscillator Meng, CC; Hsu, SK; Peng, AS; Wen, SY; Huang, GW
國立交通大學 2014-12-08T15:26:09Z A fully integrated 5.2 GHz GaInP/GaAs HBT upconversion micromixer with output LC current combiner and oscillator Meng, CC; Hsu, SK; Peng, AS; Wen, SY; Huang, GW
國立交通大學 2014-12-08T15:26:09Z A high isolation CMFB downconversion micromixer using 0.18-mu m deep N-well CMOS technology Meng, CC; Xu, SK; Wu, TH; Chao, MH; Huang, GW
國立交通大學 2014-12-08T15:25:58Z Computation of noise parameters using genetic algorithms Chen, HY; Chen, KM; Huang, GW; Cho, MH; Chang, CY
國立交通大學 2014-12-08T15:25:51Z Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors Huang, SY; Chen, KM; Huang, GW; Hsu, TL; Tseng, HC; Chang, CY
國立交通大學 2014-12-08T15:25:49Z An accurate RF CMOS gate resistance model compatible with HSPICE Lin, HW; Chung, SS; Wong, SC; Huang, GW
國立交通大學 2014-12-08T15:25:25Z Impact of hot carrier stress on RF power characteristics of MOSFETs Huang, SY; Chen, KM; Huang, GW; Yang, DY; Chang, CY; Liang, V; Tseng, HC
國立交通大學 2014-12-08T15:25:25Z A fully integrated 5.2 GHz SiGe HBT upconversion micromixer using lumped balun and LC current combiner Wu, TH; Meng, CC; Huang, GW
國立交通大學 2014-12-08T15:25:22Z Low frequency noise degradation in ultra-thin oxide (I5A) analog n-MOSFETs resulting from valence-band tunneling Wu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, C; Huang, GW; Chang, CS; Wang, T

Showing items 31-40 of 77  (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page