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Showing items 1-3 of 3 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-12T02:11:11Z |
一種存在於互補式超大型積體電路的雙橫向鎖住行為之探討
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黃恆盛; HUANG, HENG-SHENG; 張俊彥 |
| 國立交通大學 |
2014-12-08T15:09:00Z |
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs
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Hsieh, Zhen-Ying; Wang, Mu-Chun; Chen, Chih; Shieh, Jia-Min; Lin, Yu-Ting; Chen, Shuang-Yuan; Huang, Heng-Sheng |
| 國立交通大學 |
2014-12-08T15:08:03Z |
Gate-to-drain capacitance verifying the continuous-wave green laser crystallization n-TFT trapped charges distribution under dc voltage stress
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Hsieh, Zhen-Ying; Wang, Mu-Chun; Chen, Shuang-Yuan; Chen, Chih; Huang, Heng-Sheng |
Showing items 1-3 of 3 (1 Page(s) Totally)
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