| 臺大學術典藏 |
2021-07-05T07:27:53Z |
Denoising of multi b-value diffusion-weighted MR images using deep image prior
|
YU-CHUN LIN; Huang, Hsuan-Ming |
| 臺大學術典藏 |
2018-09-10T15:26:24Z |
Effective anatomical priors for emission tomographic reconstruction
|
Tsai, Yu-Jung; Huang, Huang-Ming; Chou, Cheng-Ying; Wang, Weichung; Hsiao, Ing-Tsung; Chou, Cheng-Ying; Wang, Weichung; Huang Hsuan-Ming |
| 臺大學術典藏 |
2018-09-10T05:29:44Z |
The investigation of emission reconstruction with fewer projection views for brain SPECT imaging
|
Hsiao, I.-T.;Lin, K.-J.;Huang, H.-M.;Wietholt, C.;Chen, C.-T.;Gindi, G.; Huang Hsuan-Ming |
| 國立交通大學 |
2017-04-21T06:56:48Z |
Layout-Based Soft Error Rate Estimation Framework Considering Multiple Transient Faults-From Device to Circuit Level
|
Huang, Hsuan-Ming; Wen, Charles H. -P. |
| 國立交通大學 |
2015-11-26T01:02:51Z |
軟性電子錯誤之進階效應分析-從元件層級到電路層級
|
黃宣銘; Huang, Hsuan-Ming; 溫宏斌 |
| 國立交通大學 |
2014-12-12T01:24:48Z |
分析在全電量之粒子影響下之統計性軟性電子錯誤率
|
黃宣銘; Huang, Hsuan-Ming; 溫宏斌; Wen, Hung-Pin |
| 國立交通大學 |
2014-12-08T15:43:31Z |
Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors
|
Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:32:42Z |
Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection
|
Huang, Hsuan-Ming; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Parameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD Panel
|
Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:22:06Z |
Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs
|
Peng, Huan-Kai; Huang, Hsuan-Ming; Kuo, Yu-Hsin; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:20:33Z |
A Unified Parameterization Technique for TFT-LCD Panel Design Optimization
|
Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:18:43Z |
Computational Statistics Approach to Capacitance Sensitivity Analysis and Gate Delay Time Minimization of TFT-LCDs
|
Li, Yiming; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:15:13Z |
Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
|
Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching |
| 國立交通大學 |
2014-12-08T15:13:30Z |
Discrete Dopant Induced Electrical and Thermal Fluctuation in Nanoscale SOI FinFET
|
Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:10:16Z |
Three-dimensional simulation of random-dopant-induced threshold voltage fluctuation in nanoscale Fin-typed field effect transistors
|
Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:08:33Z |
Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature
|
Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:02:42Z |
Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit
|
Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices
|
Hwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming |
| 中國文化大學 |
2013-06 |
氣候變遷調適觀點下臺北市空間脆弱度評估之研究
|
黃宣銘; Huang, Hsuan-Ming |
| 國立臺灣大學 |
2008 |
單根氮化鋁奈米線之光電導與電子傳輸特性
|
黃宣銘; Huang, Hsuan-Ming |
