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"huang po chin"的相關文件
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| 國立成功大學 |
2016-01 |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Wang, Bo-Chin; Wu, Chung-Yi; Wu, San-Lein |
| 國立臺灣大學 |
2016 |
Assessment of urinary thiodiglycolic acid exposure in school-aged children in the vicinity of a petrochemical complex in central Taiwan
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Huang, Po-Chin; Liu, Li-Hsuan; Shie, Ruei-Hao; Tsai, Chih-Hsin; Liang, Wei-Yen; Wang, Chih-Wen; Tsai, Cheng-Hsien; Chiang, Hung-Che; Chan, Chang-Chuan; 詹長權; 蔡政憲 |
| 國立交通大學 |
2015-12-02T02:59:14Z |
Incorporating a hole-transport material into the emissive layer of solid-state light-emitting electrochemical cells to improve device performance
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Huang, Po-Chin; Krucaite, Gintare; Su, Hai-Ching; Grigalevicius, Saulius |
| 國立交通大學 |
2015-11-26T00:55:54Z |
摻入電洞傳輸材料於固態有機發光電化學元件之發光層以改善元件特性
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黃柏欽; Huang, Po-Chin; 蘇海清; Su, Hai-Ching |
| 國立成功大學 |
2015-10 |
Temperature dependence of low-frequency noise characteristics in uniaxial tensile strained nMOSFETs
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Huang, Po Chin; Chang, Ching Yao; Cheng, Osbert; Wu, San Lein; Chang, Shoou Jinn |
| 國立成功大學 |
2015-09-10 |
Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO2 and ZrO2 nMOSFETs
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Wu, San-Lein; Wang, Bo Chin; Lu, Yu-Ying; Tsai, Shih-Chang; Chen, Jone-Fang; Chang, Shoou-Jinn; Chang, Sheng-Po; Hsu, Che-Hua; Yang, Chih Wei; Chen, Cheng-Guo; Cheng, Osbert; Huang, Po-Chin |
| 國立成功大學 |
2015-03 |
Impact of Uniaxial Strain on Random Telegraph Noise in High-k/Metal Gate pMOSFETs
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Huang, Po-Chin; Chen, Jone F.; Tsai, Shih Chang; Wu, San Lein; Tsai, Kai-Shiang; Kao, Tsung Hsien; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert |
| 國立成功大學 |
2014-09 |
Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High-k/Metal Gate pMOSFETs
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Kao, Tsung-Hsien; Wu, San-Lein; Wu, Chung-Yi; Fang, Yean-Kuen; Wang, Bo-Chin; Huang, Po Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
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