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"huang shih che"的相关文件
显示项目 1-10 / 31 (共4页)
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| 東海大學 |
2018 |
《論語》融入國中生命教育課程之行動研究—以親子關係、同儕關係為中心
|
黃士哲; HUANG,SHIH-CHE |
| 國立交通大學 |
2014-12-12T03:07:02Z |
多晶矽薄膜電晶體的空間與時間變動性探討
|
黃士哲; Huang, Shih-Che; 戴亞翔; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-12T02:39:19Z |
以有機金屬化學氣相沉積於碳化矽基板上成長氮化鋁鎵/氮化鎵異質結構之高電子遷移率電晶體的應用
|
黃士哲; Huang, Shih-Che; 張翼; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis
|
Huang, Shih-Che; Kao, Yu-Han; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Statistical study on the states in the low-temperature poly-silicon films with thin film transistors
|
Huang, Shih-Che; Chou, Yen-Pang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Analysis of poly-Si TFT degradation under gate pulse stress using the slicing model
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress
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Tai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin |
| 國立交通大學 |
2014-12-08T15:13:02Z |
A statistical model for simulating the effect of UPS TFT device variation for SOP applications
|
Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng |
| 國立交通大學 |
2014-12-08T15:12:16Z |
Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
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Tai, Ya-Hsiang; Huang, Shih-Che; Su, Ko-Ching; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:05Z |
Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing model
|
Kuo, Yan-Fu; Huang, Shih-Che; Chao, Yu-Te; Tai, Ya-Hsiang |
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