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"huang tiao yuan"的相關文件
顯示項目 21-30 / 181 (共19頁)
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| 國立交通大學 |
2017-04-21T06:49:44Z |
Comparison of Electrical Characteristics of N-type Silicon Junctionless Transistors with and without Film Profile Engineering by TCAD Simulation
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Tsai, Jung-Ruey; Lin, Horng-Chih; Chang, Hsiu-Fu; Shie, Bo-Shiuan; Wen, Ting-Ting; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:40Z |
STUDY OF GATE-INJECTION OPERATED SONOS-TYPE DEVICES USING THE GATE-SENSING AND CHANNEL-SENSING (GSCS) METHOD
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Du, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Huang, Tiao-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:25Z |
High-gain, Low-voltage BEOL Logic Gate Inverter Built with Film Profile Engineered IGZO Transistors
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Lyu, Rong-Jhe; Chiu, Yun-Hsuan; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer
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Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Wan, Chia-Chen; Hsueh, Fu-Kuo; Lin, Horng-Chih; Chao, Tien-Sheng; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
A comprehensive model for plasma damage enhanced transistor reliability degradation
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Weng, W. T.; Oates, A. S.; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Comparisons on performance improvement by nitride capping layer among different channel directions nMOSFETs
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Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Hsueh, Fu-Kuo; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Reliability of strained-channel NMOSFETs with SiN capping layer on Hi-wafers with a thin LPCVD-TEOS buffer layer
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Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Wan, Chia-Chen; Hsueh, Fu-Kuo; Lin, Horng-Chih; Cha, Tien-Sheng; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:09Z |
Short-Channel BEOL ZnON Thin-Film Transistors with Superior Mobility Performance
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Kuan, Chin-I; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:06Z |
Film-Profile-Engineered IGZO Thin-Film Transistors with Gate/Drain Offset for High Voltage Operation
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Wu, Ming-Hung; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:58Z |
Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors
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Zhong, Chia-Wen; Lin, Horng-Chih; Tsai, Jung-Ruey; Liu, Kou-Chen; Huang, Tiao-Yuan |
顯示項目 21-30 / 181 (共19頁)
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