| 國立交通大學 |
2017-04-21T06:49:10Z |
Comparisons on performance improvement by nitride capping layer among different channel directions nMOSFETs
|
Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Hsueh, Fu-Kuo; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Reliability of strained-channel NMOSFETs with SiN capping layer on Hi-wafers with a thin LPCVD-TEOS buffer layer
|
Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Wan, Chia-Chen; Hsueh, Fu-Kuo; Lin, Horng-Chih; Cha, Tien-Sheng; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:09Z |
Short-Channel BEOL ZnON Thin-Film Transistors with Superior Mobility Performance
|
Kuan, Chin-I; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:06Z |
Film-Profile-Engineered IGZO Thin-Film Transistors with Gate/Drain Offset for High Voltage Operation
|
Wu, Ming-Hung; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:58Z |
Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors
|
Zhong, Chia-Wen; Lin, Horng-Chih; Tsai, Jung-Ruey; Liu, Kou-Chen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:46Z |
Short-Channel ZnON Thin-Film Transistors with Film Profile Engineering
|
Kuan, Chin-I; Lin, Horng-Chih; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:46Z |
Fabrication and RTN Characteristics of Gate-All-Around Poly-Si Junctionless Nanowire Transistors
|
Yang, Chen-Chen; Chen, Yung-Chen; Lin, Horng-Chih; Chang, Ruey-Dar; Li, Pei-Wen; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:25Z |
Strain-induced channel backscattering modulation in nanoscale CMOSFETs
|
Chen, Hung-Wei; Lin, Hong-Nien; Ko, Chih-Hsin; Ge, Chung-Hu; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Wen-Chin |
| 國立交通大學 |
2016-03-28T00:04:26Z |
Impact of thermal oxygen annealing on the properties of tin oxide films and characteristics of p-type thin-film transistors
|
Zhong, Chia-Wen; Lin, Horng-Chih; Liu, Kou-Chen; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-12-02T02:59:28Z |
Improving Electrical Performances of p-Type SnO Thin-Film Transistors Using Double-Gated Structure
|
Zhong, Chia-Wen; Lin, Horng-Chih; Liu, Kou-Chen; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-12-02T02:59:25Z |
Novel InGaZnO inverters utilizing film profile engineering
|
Lin, Horng-Chih; Wu, Ming-Hung; Chan, Chin-Wen; Lyu, Rong-Jhe; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-12-02T02:59:17Z |
Film-Profile Engineered InGaZnO Thin-Film Transistors With Self-Aligned Bottom Gates
|
Shie, Bo-Shiuan; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-12-02T02:59:17Z |
Impact of Residual Hardmask Wires on the Performance of Film-Profile-Engineered ZnO Thin-Film Transistors With Discrete Bottom Gates
|
Lyu, Rong-Jhe; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T01:06:38Z |
以氧化鉿為介電層的電阻式記憶體之電性與分析
|
王佳文; Wang, Chia-Wen; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T01:04:09Z |
未摻雜之氧化鋅薄膜電晶體的製作與特性分析
|
李信宏; Shin-Hung Li; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T01:04:09Z |
a-IGZO 薄膜電晶體的製作與特性分析
|
張維軒; Chang, Wei-Hsuan; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T01:02:37Z |
利用氮化鋁鈍化層與遠端電漿表面處理於銦化砷鎵金氧半場效電晶體之電性與可靠度分析
|
陳錦瀚; Chen, Chin-Han; 張翼; 黃調元; Chang, Yi; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T01:01:59Z |
使用氮化鋁及閘極介電質成長後電漿處理法改善三五族砷化銦鎵場效電晶體元件特性之研究
|
鄭守博; Cheng, Shou-Po; 黃國威; 黃調元; Huang, Guo-Wei; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T00:57:16Z |
探討保護層對於非晶態銦鎵鋅氧化物薄膜電晶體穩定性之影響
|
張智斌; Chang, Chih-Bin; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T00:57:15Z |
氮化矽側壁硬式光罩製造之環繞式閘極多晶矽無接面奈米線薄膜電晶體特性研究
|
簡崇哲; Chien, Chung-Che; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T00:57:14Z |
無機保護層對一氧化錫薄膜電晶體特性與穩定度之影響探討
|
蔡昕佑; Tsai, Hsin-You; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-11-26T00:56:11Z |
平面式與三閘極結構之N型無接面多晶矽薄膜電晶體的研製與分析
|
林政頤; Lin, Cheng-I; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-07-21T11:20:45Z |
Fabrication of High-Performance Poly-Si Thin-Film Transistors With Sub-Lithographic Channel Dimensions
|
Lee, Ko-Hui; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-07-21T11:20:25Z |
Effects of Gate Dielectric and Process Treatments on the Electrical Characteristics of IGZO TFTs With Film Profile Engineering
|
Shie, Bo-Shiuan; Lin, Horng-Chih; Lyu, Rong-Jye; Huang, Tiao-Yuan |
| 國立交通大學 |
2015-07-21T08:31:07Z |
Film Profile Engineering (FPE): A New Concept for Manufacturing of Short-Channel Metal Oxide TFTs
|
Lyu, Rong-Jhe; Lin, Horng-Chih; Wu, Ming-Hung; Shie, Bo-Shiuan; Hung, Hsiang-Ting; Huang, Tiao-Yuan |
