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Taiwan Academic Institutional Repository >
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"huang ty"
Showing items 121-130 of 206 (21 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:37:06Z |
Determination of effective density-of-states using a novel Schottky barrier poly-Si thin-film transistor
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Lin, HC; Lee, MH; Yeh, KL; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Localized lateral growth of single-walled carbon nanotubes for field-effect transistors by a cobalt-mix-TEOS method
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Chen, BH; Lo, PY; Wei, JH; Tsai, MJ; Hwang, CL; Chao, TS; Lin, HC; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:00Z |
Estimating driving performance based on EEG spectrum analysis
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Lin, CT; Wu, RC; Jung, TP; Liang, SF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:36:15Z |
Modeling mechanical stress effect on dopant diffusion in scaled MOSFETs
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Sheu, YM; Yang, SJ; Wang, CC; Chang, CS; Huang, LP; Huang, TY; Chen, MJ; Diaz, CH |
| 國立交通大學 |
2014-12-08T15:36:00Z |
Low-temperature growth of polycrystalline ge films on SiO2 substrate by HDPCVD
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Yang, MJ; Shieh, J; Hsu, SL; Huang, IJ; Leu, CC; Shen, SW; Huang, TY; Lehnen, P; Chien, CH |
| 國立交通大學 |
2014-12-08T15:27:25Z |
A model for photoresist-induced charging damage in ultra-thin gate oxides
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Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
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Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:27:08Z |
Characterization and lithographic parameters extraction for the modified resists
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Ko, FH; Lu, JK; Chu, TC; Huang, TY; Yang, CC; Sheu, JT; Huang, HL |
| 國立交通大學 |
2014-12-08T15:27:07Z |
New insights on RF CMOS stability related to bias, scaling, and temperature
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Su, JG; Wong, SC; Chang, CY; Chiu, KY; Huang, TY; Ou, CT; Kao, CH; Chao, CJ |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide
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Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS |
Showing items 121-130 of 206 (21 Page(s) Totally)
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