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Taiwan Academic Institutional Repository >
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"huang ty"
Showing items 116-165 of 206 (5 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:39:08Z |
Hot-carrier effects on power characteristics of SiGeHBTs
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Huang, SY; Chen, KM; Huang, GW; Tseng, HC; Hsu, TL; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:26Z |
The characteristics of hole trapping in HfO2/SiO2 gate dielectrics with TiN gate electrode
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Lu, WT; Lin, PC; Huang, TY; Chien, CH; Yang, MJ; Huang, IJ; Lehnen, P |
| 國立交通大學 |
2014-12-08T15:37:15Z |
HfO2 MIS capacitor with copper gate electrode
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Perng, TH; Chien, CH; Chen, CW; Yang, MJ; Lehnen, P; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:09Z |
Effects of low-temperature NH3 treatment on the characteristics of HfO2/SiO2 gate stack
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Lu, WT; Chien, CH; Huang, IJ; Yang, MJ; Lehnen, P; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:08Z |
Automated information. mining on multimedia TV news archives
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Lai, PS; Cheng, SS; Sun, SY; Huang, TY; Su, JM; Xu, YY; Chen, YH; Chuang, SC; Tseng, CL; Hsieh, CL; Lu, YL; Shen, YC; Chen, JR; Niel, JB; Tsai, FP; Huang, HC; Pao, HT; Fu, HC |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Determination of effective density-of-states using a novel Schottky barrier poly-Si thin-film transistor
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Lin, HC; Lee, MH; Yeh, KL; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Localized lateral growth of single-walled carbon nanotubes for field-effect transistors by a cobalt-mix-TEOS method
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Chen, BH; Lo, PY; Wei, JH; Tsai, MJ; Hwang, CL; Chao, TS; Lin, HC; Huang, TY |
| 國立交通大學 |
2014-12-08T15:37:00Z |
Estimating driving performance based on EEG spectrum analysis
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Lin, CT; Wu, RC; Jung, TP; Liang, SF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:36:15Z |
Modeling mechanical stress effect on dopant diffusion in scaled MOSFETs
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Sheu, YM; Yang, SJ; Wang, CC; Chang, CS; Huang, LP; Huang, TY; Chen, MJ; Diaz, CH |
| 國立交通大學 |
2014-12-08T15:36:00Z |
Low-temperature growth of polycrystalline ge films on SiO2 substrate by HDPCVD
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Yang, MJ; Shieh, J; Hsu, SL; Huang, IJ; Leu, CC; Shen, SW; Huang, TY; Lehnen, P; Chien, CH |
| 國立交通大學 |
2014-12-08T15:27:25Z |
A model for photoresist-induced charging damage in ultra-thin gate oxides
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Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
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Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:27:08Z |
Characterization and lithographic parameters extraction for the modified resists
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Ko, FH; Lu, JK; Chu, TC; Huang, TY; Yang, CC; Sheu, JT; Huang, HL |
| 國立交通大學 |
2014-12-08T15:27:07Z |
New insights on RF CMOS stability related to bias, scaling, and temperature
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Su, JG; Wong, SC; Chang, CY; Chiu, KY; Huang, TY; Ou, CT; Kao, CH; Chao, CJ |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide
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Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation
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Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:26:58Z |
Characterization and modeling of out-diffusion of cesium, manganese and zinc impurities from deep ultraviolet photoresist
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Ko, FH; Wang, MY; Wang, TK; Yang, CC; Huang, TY; Wu, CS |
| 國立交通大學 |
2014-12-08T15:26:56Z |
Film characterization and evaluation of process performance for the modified electron beam resist
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Ko, FH; Ting, JH; Chou, CT; Hsiao, LT; Huang, TY; Dai, BT |
| 國立交通大學 |
2014-12-08T15:26:54Z |
Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors
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Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:26:48Z |
Investigations of bulk dynamic threshold-voltage MOSFET with 65GHz "normal-mode" Ft and 220GHz "over-drive mode" Ft for RF applications
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Chang, CY; Su, JG; Hsu, HM; Wong, SC; Huang, TY; Sun, YC |
| 國立交通大學 |
2014-12-08T15:26:36Z |
Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs
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Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate
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Yu, CM; Lin, HC; Lei, TF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Characteristics of Schottky barrier poly-Si thin film transistors with excimer laser annealing treatment
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Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology
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Lee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Strongly regular graphs associated with bent functions
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Huang, TY; You, KH |
| 國立交通大學 |
2014-12-08T15:25:47Z |
NBTI effects of pMOSFETs with different nitrogen dose imlantation
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Lee, YJ; Tang, LC; Wu, MH; Chao, TS; Ho, PT; Lai, D; Yang, WL; Huang, TY |
| 國立交通大學 |
2014-12-08T15:25:46Z |
EEG-based fuzzy neural network estimator for driving performance
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Wu, RC; Lin, CT; Liang, SF; Huang, TY; Jung, TP |
| 國立交通大學 |
2014-12-08T15:25:46Z |
Estimating driving performance based on EEG spectrum and fuzzy neural network
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Wu, RC; Lin, CT; Liang, SF; Huang, TY; Chen, YC; Jung, TP |
| 國立交通大學 |
2014-12-08T15:25:43Z |
A novel methodology for extracting effective density-of-states in poly-Si thin-film transistors
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Lin, HC; Yeh, KL; Lee, MH; Su, YC; Huang, TY; Shen, SW; Lin, HY |
| 國立交通大學 |
2014-12-08T15:25:40Z |
The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Assessment of driver's driving performance and alertness using EEG-based fuzzy neural networks
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Lin, CT; Chen, YC; Wu, RC; Liang, SF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Classification of driver's cognitive responses from EEG analysis
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Liang, SF; Lin, CT; Wu, RC; Huang, TY; Chao, WH |
| 國立交通大學 |
2014-12-08T15:25:11Z |
Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drain
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC |
| 國立交通大學 |
2014-12-08T15:19:33Z |
An improved approach for small-signal equivalent-circuit parameter determination of InGaP/GaAs HBT
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Chen, HY; Chen, KM; Huang, GW; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:18:51Z |
High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts
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Lee, YJ; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A simple and low-cost method to fabricate TFTs with poly-Si nanowire channel
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Lin, HC; Lee, MH; Su, CJ; Huang, TY; Lee, CC; Yang, YS |
| 國立交通大學 |
2014-12-08T15:18:31Z |
Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETs
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC |
| 國立交通大學 |
2014-12-08T15:18:06Z |
Improvements on electrical characteristics of p-channel metal-oxide-semiconductor field effect transistors with HfO(2) gate stacks by post deposition N(2)O plasma treatment
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Lu, WT; Chien, CH; Lan, WT; Lee, TC; Yang, MJ; Shen, SW; Lehnen, P; Huang, TY |
| 國立交通大學 |
2014-12-08T15:18:02Z |
Improved SPM tolerance and cost-effective phase-modulation duobinary transmission over 230-km standard single-mode fiber using a single Mach-Zehnder modulator
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Lu, YC; Chen, J; Feng, KM; Yeh, PC; Huang, TY; Peng, WR; Huang, MF; Wei, CC |
| 國立交通大學 |
2014-12-08T15:17:35Z |
Impacts of uniaxial compressive strain on dynamic negative bias temperature instability of p-channel MOSFETs
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Lu, CY; Lin, HC; Huang, TY |
| 國立交通大學 |
2014-12-08T15:17:20Z |
Complementary carbon nanotube-gated carbon nanotube thin-film transistor
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Chen, BH; Lin, HC; Huang, TY; Wei, JH; Wang, HH; Tsai, MJ; Chao, TS |
| 國立交通大學 |
2014-12-08T15:17:19Z |
Crystal orientation and nitrogen effects on the carrier mobility of p-type metal oxide semiconductor field effect transistor with ultra thin gate dielectrics
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Lee, YJ; Ho, PT; Yang, WL; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:17:01Z |
Device characteristics and aggravated negative bias temperature instability in p-channel metal-oxide-semiconductor field-effect transistors with uniaxial compressive strain
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Lu, CY; Lin, HC; Chang, YF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:16:58Z |
Improved reliability of HfO2/SiON gate stack by fluorine incorporation
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Lu, WT; Chiein, CH; Lan, WT; Lee, TC; Lehnen, P; Huang, TY |
| 國立交通大學 |
2014-12-08T15:16:17Z |
High-performance TFTs with Si nanowire channels enhanced by metal-induced lateral crystallization
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Su, CJ; Lin, HC; Huang, TY |
| 國立交通大學 |
2014-12-08T15:04:33Z |
(S, R, MU)-NETS AND ALTERNATING FORMS GRAPHS
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HUANG, TY; LAURENT, M |
| 國立交通大學 |
2014-12-08T15:04:12Z |
SPECTRAL CHARACTERIZATION OF ODD GRAPHS OK, K-LESS-THAN-OR-EQUAL-TO-6
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HUANG, TY |
| 國立交通大學 |
2014-12-08T15:03:55Z |
A UNIFIED APPROACH TO A CHARACTERIZATION OF GRASSMANN GRAPHS AND BILINEAR-FORMS GRAPHS
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FU, TS; HUANG, TY |
| 國立交通大學 |
2014-12-08T15:02:41Z |
Quasi-semisymmetric designs with extremal conditions
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Fu, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:02:25Z |
Characterization of antenna effect by nondestructive gate current measurement
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Lin, HC; Chien, CH; Huang, TY |
Showing items 116-165 of 206 (5 Page(s) Totally)
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