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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 126-150 of 210  (9 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:36:00Z Low-temperature growth of polycrystalline ge films on SiO2 substrate by HDPCVD Yang, MJ; Shieh, J; Hsu, SL; Huang, IJ; Leu, CC; Shen, SW; Huang, TY; Lehnen, P; Chien, CH
國立交通大學 2014-12-08T15:27:25Z A model for photoresist-induced charging damage in ultra-thin gate oxides Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:27:09Z Breakdown characteristics of ultra-thin gate oxides caused by plasma charging Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY
國立交通大學 2014-12-08T15:27:08Z Characterization and lithographic parameters extraction for the modified resists Ko, FH; Lu, JK; Chu, TC; Huang, TY; Yang, CC; Sheu, JT; Huang, HL
國立交通大學 2014-12-08T15:27:07Z New insights on RF CMOS stability related to bias, scaling, and temperature Su, JG; Wong, SC; Chang, CY; Chiu, KY; Huang, TY; Ou, CT; Kao, CH; Chao, CJ
國立交通大學 2014-12-08T15:27:02Z Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS
國立交通大學 2014-12-08T15:27:02Z Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS
國立交通大學 2014-12-08T15:26:58Z Characterization and modeling of out-diffusion of cesium, manganese and zinc impurities from deep ultraviolet photoresist Ko, FH; Wang, MY; Wang, TK; Yang, CC; Huang, TY; Wu, CS
國立交通大學 2014-12-08T15:26:56Z Film characterization and evaluation of process performance for the modified electron beam resist Ko, FH; Ting, JH; Chou, CT; Hsiao, LT; Huang, TY; Dai, BT
國立交通大學 2014-12-08T15:26:54Z Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY
國立交通大學 2014-12-08T15:26:48Z Investigations of bulk dynamic threshold-voltage MOSFET with 65GHz "normal-mode" Ft and 220GHz "over-drive mode" Ft for RF applications Chang, CY; Su, JG; Hsu, HM; Wong, SC; Huang, TY; Sun, YC
國立交通大學 2014-12-08T15:26:36Z Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T
國立交通大學 2014-12-08T15:26:17Z Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate Yu, CM; Lin, HC; Lei, TF; Huang, TY
國立交通大學 2014-12-08T15:26:17Z Characteristics of Schottky barrier poly-Si thin film transistors with excimer laser annealing treatment Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY
國立交通大學 2014-12-08T15:26:17Z Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology Lee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS
國立交通大學 2014-12-08T15:25:49Z Strongly regular graphs associated with bent functions Huang, TY; You, KH
國立交通大學 2014-12-08T15:25:47Z NBTI effects of pMOSFETs with different nitrogen dose imlantation Lee, YJ; Tang, LC; Wu, MH; Chao, TS; Ho, PT; Lai, D; Yang, WL; Huang, TY
國立交通大學 2014-12-08T15:25:46Z EEG-based fuzzy neural network estimator for driving performance Wu, RC; Lin, CT; Liang, SF; Huang, TY; Jung, TP
國立交通大學 2014-12-08T15:25:46Z Estimating driving performance based on EEG spectrum and fuzzy neural network Wu, RC; Lin, CT; Liang, SF; Huang, TY; Chen, YC; Jung, TP
國立交通大學 2014-12-08T15:25:43Z A novel methodology for extracting effective density-of-states in poly-Si thin-film transistors Lin, HC; Yeh, KL; Lee, MH; Su, YC; Huang, TY; Shen, SW; Lin, HY
國立交通大學 2014-12-08T15:25:40Z The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD
國立交通大學 2014-12-08T15:25:22Z Assessment of driver's driving performance and alertness using EEG-based fuzzy neural networks Lin, CT; Chen, YC; Wu, RC; Liang, SF; Huang, TY
國立交通大學 2014-12-08T15:25:22Z Classification of driver's cognitive responses from EEG analysis Liang, SF; Lin, CT; Wu, RC; Huang, TY; Chao, WH
國立交通大學 2014-12-08T15:25:11Z Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drain Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC
國立交通大學 2014-12-08T15:19:33Z An improved approach for small-signal equivalent-circuit parameter determination of InGaP/GaAs HBT Chen, HY; Chen, KM; Huang, GW; Chang, CY; Huang, TY

Showing items 126-150 of 210  (9 Page(s) Totally)
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