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Institution	Date	Title	Author
國立成功大學	2014	Modelling and characterisation of flat-band roll-off behaviours in LaOx capped high-K/metal-gate NMOSFET with 28 nm CMOS technology	Hung, Wen-Han; Juang, Feng-Renn; Fang, Yean-Kuen; Cheng, Tzyy-Ming

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